Event-Responsive Beam-Modulated STEM with Multi-Frame and Sparse Scanning

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Bibliographic Details
Published in:Microscopy and microanalysis 2024-07, Vol.30 (Supplement_1)
Main Authors: Mosse, Matthew, Peters, Jonathan J P, Reed, Bryan W, Masiel, Daniel J, Conroy, Michele, Jones, Lewys
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1093/mam/ozae044.191