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Multifunctional scanning ion conductance microscopy
Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that has traditionally been used to image topography or to deliver species to an interface, particularly in a biological setting. This article highlights the recent blossoming of SICM into a technique with a much greater div...
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Published in: | Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences Mathematical, physical, and engineering sciences, 2017-04, Vol.473 (2200), p.20160889-20160889 |
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container_title | Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences |
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creator | Page, Ashley Perry, David Unwin, Patrick R. |
description | Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that has traditionally been used to image topography or to deliver species to an interface, particularly in a biological setting. This article highlights the recent blossoming of SICM into a technique with a much greater diversity of applications and capability that can be used either standalone, with advanced control (potential–time) functions, or in tandem with other methods. SICM can be used to elucidate functional information about interfaces, such as surface charge density or electrochemical activity (ion fluxes). Using a multi-barrel probe format, SICM-related techniques can be employed to deposit nanoscale three-dimensional structures and further functionality is realized when SICM is combined with scanning electrochemical microscopy (SECM), with simultaneous measurements from a single probe opening up considerable prospects for multifunctional imaging. SICM studies are greatly enhanced by finite-element method modelling for quantitative treatment of issues such as resolution, surface charge and (tip) geometry effects. SICM is particularly applicable to the study of living systems, notably single cells, although applications extend to materials characterization and to new methods of printing and nanofabrication. A more thorough understanding of the electrochemical principles and properties of SICM provides a foundation for significant applications of SICM in electrochemistry and interfacial science. |
doi_str_mv | 10.1098/rspa.2016.0889 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1098_rspa_2016_0889</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1896897549</sourcerecordid><originalsourceid>FETCH-LOGICAL-c528t-588256aeace373ca6b6cd1e369cc39ab1d03e43534e084a76b0aaca276d202103</originalsourceid><addsrcrecordid>eNptkUtrGzEUhUVoyKvZdlkM3WQzjt4jbQolJGkhIZt0La7vyI7CWHKlmYD_fTU4MWnJShL6dO7ROYR8YXTOqDWXuWxgzinTc2qMPSAnTLas4VbqT3UvtGwU5eyYnJbyTCm1yrRH5JgbaaQQ_ISI-7EfwnKMOIQUoZ8VhBhDXM3qcYYpdiMOENHP1gFzKpg228_kcAl98eev6xn5fXP9ePWzuXu4_XX1465Bxc3QKGO40uABvWgFgl5o7JgX2iIKCwvWUeGlUEJ6aiS0ekEBEHirO149U3FGvu90N-Ni7Tv0ccjQu00Oa8hblyC4f29ieHKr9OKUZEpbXgUuXgVy-jP6Mrh1KOj7HqJPY3HMWG1sq6St6Lf_0Oc05hpIpWzNinMmJkfzHTVFUbJf7s0w6qY-3NSHm_pwUx_1wdf3X9jjbwVUQOyAnLZ1WMLgh-272R_L_gUDBZjc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1984322130</pqid></control><display><type>article</type><title>Multifunctional scanning ion conductance microscopy</title><source>JSTOR Archival Journals and Primary Sources Collection</source><source>Royal Society Publishing Jisc Collections Royal Society Journals Read & Publish Transitional Agreement 2025 (reading list)</source><creator>Page, Ashley ; Perry, David ; Unwin, Patrick R.</creator><creatorcontrib>Page, Ashley ; Perry, David ; Unwin, Patrick R.</creatorcontrib><description>Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that has traditionally been used to image topography or to deliver species to an interface, particularly in a biological setting. This article highlights the recent blossoming of SICM into a technique with a much greater diversity of applications and capability that can be used either standalone, with advanced control (potential–time) functions, or in tandem with other methods. SICM can be used to elucidate functional information about interfaces, such as surface charge density or electrochemical activity (ion fluxes). Using a multi-barrel probe format, SICM-related techniques can be employed to deposit nanoscale three-dimensional structures and further functionality is realized when SICM is combined with scanning electrochemical microscopy (SECM), with simultaneous measurements from a single probe opening up considerable prospects for multifunctional imaging. SICM studies are greatly enhanced by finite-element method modelling for quantitative treatment of issues such as resolution, surface charge and (tip) geometry effects. SICM is particularly applicable to the study of living systems, notably single cells, although applications extend to materials characterization and to new methods of printing and nanofabrication. A more thorough understanding of the electrochemical principles and properties of SICM provides a foundation for significant applications of SICM in electrochemistry and interfacial science.</description><edition>Royal Society (Great Britain)</edition><identifier>ISSN: 1364-5021</identifier><identifier>EISSN: 1471-2946</identifier><identifier>DOI: 10.1098/rspa.2016.0889</identifier><identifier>PMID: 28484332</identifier><language>eng</language><publisher>England: The Royal Society Publishing</publisher><subject>Cellular Imaging ; Charge density ; Charge Mapping ; Electrochemical Imaging ; Electrochemistry ; Finite element method ; Ion flux ; Microscopy ; Nanofabrication ; Nanopipette ; Review ; Scanning Ion Conductance Microscopy ; Single-Cell Analysis ; Special Feature ; Surface charge</subject><ispartof>Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences, 2017-04, Vol.473 (2200), p.20160889-20160889</ispartof><rights>2017 The Author(s)</rights><rights>Copyright The Royal Society Publishing Apr 2017</rights><rights>2017 The Author(s) 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c528t-588256aeace373ca6b6cd1e369cc39ab1d03e43534e084a76b0aaca276d202103</citedby><cites>FETCH-LOGICAL-c528t-588256aeace373ca6b6cd1e369cc39ab1d03e43534e084a76b0aaca276d202103</cites><orcidid>0000-0002-8630-4798</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/28484332$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Page, Ashley</creatorcontrib><creatorcontrib>Perry, David</creatorcontrib><creatorcontrib>Unwin, Patrick R.</creatorcontrib><title>Multifunctional scanning ion conductance microscopy</title><title>Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences</title><addtitle>Proc. R. Soc. A</addtitle><addtitle>Proc Math Phys Eng Sci</addtitle><description>Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that has traditionally been used to image topography or to deliver species to an interface, particularly in a biological setting. This article highlights the recent blossoming of SICM into a technique with a much greater diversity of applications and capability that can be used either standalone, with advanced control (potential–time) functions, or in tandem with other methods. SICM can be used to elucidate functional information about interfaces, such as surface charge density or electrochemical activity (ion fluxes). Using a multi-barrel probe format, SICM-related techniques can be employed to deposit nanoscale three-dimensional structures and further functionality is realized when SICM is combined with scanning electrochemical microscopy (SECM), with simultaneous measurements from a single probe opening up considerable prospects for multifunctional imaging. SICM studies are greatly enhanced by finite-element method modelling for quantitative treatment of issues such as resolution, surface charge and (tip) geometry effects. SICM is particularly applicable to the study of living systems, notably single cells, although applications extend to materials characterization and to new methods of printing and nanofabrication. A more thorough understanding of the electrochemical principles and properties of SICM provides a foundation for significant applications of SICM in electrochemistry and interfacial science.</description><subject>Cellular Imaging</subject><subject>Charge density</subject><subject>Charge Mapping</subject><subject>Electrochemical Imaging</subject><subject>Electrochemistry</subject><subject>Finite element method</subject><subject>Ion flux</subject><subject>Microscopy</subject><subject>Nanofabrication</subject><subject>Nanopipette</subject><subject>Review</subject><subject>Scanning Ion Conductance Microscopy</subject><subject>Single-Cell Analysis</subject><subject>Special Feature</subject><subject>Surface charge</subject><issn>1364-5021</issn><issn>1471-2946</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNptkUtrGzEUhUVoyKvZdlkM3WQzjt4jbQolJGkhIZt0La7vyI7CWHKlmYD_fTU4MWnJShL6dO7ROYR8YXTOqDWXuWxgzinTc2qMPSAnTLas4VbqT3UvtGwU5eyYnJbyTCm1yrRH5JgbaaQQ_ISI-7EfwnKMOIQUoZ8VhBhDXM3qcYYpdiMOENHP1gFzKpg228_kcAl98eev6xn5fXP9ePWzuXu4_XX1465Bxc3QKGO40uABvWgFgl5o7JgX2iIKCwvWUeGlUEJ6aiS0ekEBEHirO149U3FGvu90N-Ni7Tv0ccjQu00Oa8hblyC4f29ieHKr9OKUZEpbXgUuXgVy-jP6Mrh1KOj7HqJPY3HMWG1sq6St6Lf_0Oc05hpIpWzNinMmJkfzHTVFUbJf7s0w6qY-3NSHm_pwUx_1wdf3X9jjbwVUQOyAnLZ1WMLgh-272R_L_gUDBZjc</recordid><startdate>20170401</startdate><enddate>20170401</enddate><creator>Page, Ashley</creator><creator>Perry, David</creator><creator>Unwin, Patrick R.</creator><general>The Royal Society Publishing</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>5PM</scope><orcidid>https://orcid.org/0000-0002-8630-4798</orcidid></search><sort><creationdate>20170401</creationdate><title>Multifunctional scanning ion conductance microscopy</title><author>Page, Ashley ; Perry, David ; Unwin, Patrick R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c528t-588256aeace373ca6b6cd1e369cc39ab1d03e43534e084a76b0aaca276d202103</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Cellular Imaging</topic><topic>Charge density</topic><topic>Charge Mapping</topic><topic>Electrochemical Imaging</topic><topic>Electrochemistry</topic><topic>Finite element method</topic><topic>Ion flux</topic><topic>Microscopy</topic><topic>Nanofabrication</topic><topic>Nanopipette</topic><topic>Review</topic><topic>Scanning Ion Conductance Microscopy</topic><topic>Single-Cell Analysis</topic><topic>Special Feature</topic><topic>Surface charge</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Page, Ashley</creatorcontrib><creatorcontrib>Perry, David</creatorcontrib><creatorcontrib>Unwin, Patrick R.</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Page, Ashley</au><au>Perry, David</au><au>Unwin, Patrick R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multifunctional scanning ion conductance microscopy</atitle><jtitle>Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences</jtitle><stitle>Proc. R. Soc. A</stitle><addtitle>Proc Math Phys Eng Sci</addtitle><date>2017-04-01</date><risdate>2017</risdate><volume>473</volume><issue>2200</issue><spage>20160889</spage><epage>20160889</epage><pages>20160889-20160889</pages><issn>1364-5021</issn><eissn>1471-2946</eissn><abstract>Scanning ion conductance microscopy (SICM) is a nanopipette-based technique that has traditionally been used to image topography or to deliver species to an interface, particularly in a biological setting. This article highlights the recent blossoming of SICM into a technique with a much greater diversity of applications and capability that can be used either standalone, with advanced control (potential–time) functions, or in tandem with other methods. SICM can be used to elucidate functional information about interfaces, such as surface charge density or electrochemical activity (ion fluxes). Using a multi-barrel probe format, SICM-related techniques can be employed to deposit nanoscale three-dimensional structures and further functionality is realized when SICM is combined with scanning electrochemical microscopy (SECM), with simultaneous measurements from a single probe opening up considerable prospects for multifunctional imaging. SICM studies are greatly enhanced by finite-element method modelling for quantitative treatment of issues such as resolution, surface charge and (tip) geometry effects. SICM is particularly applicable to the study of living systems, notably single cells, although applications extend to materials characterization and to new methods of printing and nanofabrication. A more thorough understanding of the electrochemical principles and properties of SICM provides a foundation for significant applications of SICM in electrochemistry and interfacial science.</abstract><cop>England</cop><pub>The Royal Society Publishing</pub><pmid>28484332</pmid><doi>10.1098/rspa.2016.0889</doi><tpages>1</tpages><edition>Royal Society (Great Britain)</edition><orcidid>https://orcid.org/0000-0002-8630-4798</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Cellular Imaging Charge density Charge Mapping Electrochemical Imaging Electrochemistry Finite element method Ion flux Microscopy Nanofabrication Nanopipette Review Scanning Ion Conductance Microscopy Single-Cell Analysis Special Feature Surface charge |
title | Multifunctional scanning ion conductance microscopy |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T17%3A08%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Multifunctional%20scanning%20ion%20conductance%20microscopy&rft.jtitle=Proceedings%20of%20the%20Royal%20Society.%20A,%20Mathematical,%20physical,%20and%20engineering%20sciences&rft.au=Page,%20Ashley&rft.date=2017-04-01&rft.volume=473&rft.issue=2200&rft.spage=20160889&rft.epage=20160889&rft.pages=20160889-20160889&rft.issn=1364-5021&rft.eissn=1471-2946&rft_id=info:doi/10.1098/rspa.2016.0889&rft_dat=%3Cproquest_cross%3E1896897549%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c528t-588256aeace373ca6b6cd1e369cc39ab1d03e43534e084a76b0aaca276d202103%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1984322130&rft_id=info:pmid/28484332&rfr_iscdi=true |