Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1983-01, Vol.27 (2), p.1079-1087
Main Authors: Galvin, G. J., Thompson, Michael O., Mayer, J. W., Peercy, P. S., Hammond, R. B., Paulter, N.
Format: Article
Language:English
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ISSN:0163-1829
DOI:10.1103/PhysRevB.27.1079