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Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing
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Published in: | Physical review. B, Condensed matter Condensed matter, 1983-01, Vol.27 (2), p.1079-1087 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
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cites | cdi_FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583 |
container_end_page | 1087 |
container_issue | 2 |
container_start_page | 1079 |
container_title | Physical review. B, Condensed matter |
container_volume | 27 |
creator | Galvin, G. J. Thompson, Michael O. Mayer, J. W. Peercy, P. S. Hammond, R. B. Paulter, N. |
description | |
doi_str_mv | 10.1103/PhysRevB.27.1079 |
format | article |
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identifier | ISSN: 0163-1829 |
ispartof | Physical review. B, Condensed matter, 1983-01, Vol.27 (2), p.1079-1087 |
issn | 0163-1829 |
language | eng |
recordid | cdi_crossref_primary_10_1103_PhysRevB_27_1079 |
source | American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list) |
title | Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing |
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