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Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing

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Published in:Physical review. B, Condensed matter Condensed matter, 1983-01, Vol.27 (2), p.1079-1087
Main Authors: Galvin, G. J., Thompson, Michael O., Mayer, J. W., Peercy, P. S., Hammond, R. B., Paulter, N.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583
cites cdi_FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583
container_end_page 1087
container_issue 2
container_start_page 1079
container_title Physical review. B, Condensed matter
container_volume 27
creator Galvin, G. J.
Thompson, Michael O.
Mayer, J. W.
Peercy, P. S.
Hammond, R. B.
Paulter, N.
description
doi_str_mv 10.1103/PhysRevB.27.1079
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevB_27_1079</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevB_27_1079</sourcerecordid><originalsourceid>FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583</originalsourceid><addsrcrecordid>eNo1kMtOwzAQRb0AiVLYs_QPpPiRh72EikelSiBU1tbYHkOQk1R2Uql_TyrKbK7m3pnR6BByx9mKcybv37-P-QMPjyvRrDhr9AVZMF7Lgiuhr8h1zj9sLlHrBTG7tsMiYR7iAT11Q-8nN0LvkELvacIQ8dx3CHlK2GE_ZjoEmtvYzvPUT6ntv-h-ihl9ESFjmnd7hDjbN-QywBzcnnVJPp-fduvXYvv2slk_bAsnajUWoEOQmoPS2gFDKZxEIWsv6-C54164UjuPpVWlRV6hDQBWeUBpbeUqJZeE_d11ach5ftvsU9tBOhrOzAmK-YdiRGNOUOQvVAZdHg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing</title><source>American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list)</source><creator>Galvin, G. J. ; Thompson, Michael O. ; Mayer, J. W. ; Peercy, P. S. ; Hammond, R. B. ; Paulter, N.</creator><creatorcontrib>Galvin, G. J. ; Thompson, Michael O. ; Mayer, J. W. ; Peercy, P. S. ; Hammond, R. B. ; Paulter, N.</creatorcontrib><identifier>ISSN: 0163-1829</identifier><identifier>DOI: 10.1103/PhysRevB.27.1079</identifier><language>eng</language><ispartof>Physical review. B, Condensed matter, 1983-01, Vol.27 (2), p.1079-1087</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583</citedby><cites>FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Galvin, G. J.</creatorcontrib><creatorcontrib>Thompson, Michael O.</creatorcontrib><creatorcontrib>Mayer, J. W.</creatorcontrib><creatorcontrib>Peercy, P. S.</creatorcontrib><creatorcontrib>Hammond, R. B.</creatorcontrib><creatorcontrib>Paulter, N.</creatorcontrib><title>Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing</title><title>Physical review. B, Condensed matter</title><issn>0163-1829</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNo1kMtOwzAQRb0AiVLYs_QPpPiRh72EikelSiBU1tbYHkOQk1R2Uql_TyrKbK7m3pnR6BByx9mKcybv37-P-QMPjyvRrDhr9AVZMF7Lgiuhr8h1zj9sLlHrBTG7tsMiYR7iAT11Q-8nN0LvkELvacIQ8dx3CHlK2GE_ZjoEmtvYzvPUT6ntv-h-ihl9ESFjmnd7hDjbN-QywBzcnnVJPp-fduvXYvv2slk_bAsnajUWoEOQmoPS2gFDKZxEIWsv6-C54164UjuPpVWlRV6hDQBWeUBpbeUqJZeE_d11ach5ftvsU9tBOhrOzAmK-YdiRGNOUOQvVAZdHg</recordid><startdate>19830101</startdate><enddate>19830101</enddate><creator>Galvin, G. J.</creator><creator>Thompson, Michael O.</creator><creator>Mayer, J. W.</creator><creator>Peercy, P. S.</creator><creator>Hammond, R. B.</creator><creator>Paulter, N.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19830101</creationdate><title>Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing</title><author>Galvin, G. J. ; Thompson, Michael O. ; Mayer, J. W. ; Peercy, P. S. ; Hammond, R. B. ; Paulter, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Galvin, G. J.</creatorcontrib><creatorcontrib>Thompson, Michael O.</creatorcontrib><creatorcontrib>Mayer, J. W.</creatorcontrib><creatorcontrib>Peercy, P. S.</creatorcontrib><creatorcontrib>Hammond, R. B.</creatorcontrib><creatorcontrib>Paulter, N.</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Galvin, G. J.</au><au>Thompson, Michael O.</au><au>Mayer, J. W.</au><au>Peercy, P. S.</au><au>Hammond, R. B.</au><au>Paulter, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing</atitle><jtitle>Physical review. B, Condensed matter</jtitle><date>1983-01-01</date><risdate>1983</risdate><volume>27</volume><issue>2</issue><spage>1079</spage><epage>1087</epage><pages>1079-1087</pages><issn>0163-1829</issn><doi>10.1103/PhysRevB.27.1079</doi><tpages>9</tpages></addata></record>
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ispartof Physical review. B, Condensed matter, 1983-01, Vol.27 (2), p.1079-1087
issn 0163-1829
language eng
recordid cdi_crossref_primary_10_1103_PhysRevB_27_1079
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title Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T02%3A44%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Time-resolved%20conductance%20and%20reflectance%20measurements%20of%20silicon%20during%20pulsed-laser%20annealing&rft.jtitle=Physical%20review.%20B,%20Condensed%20matter&rft.au=Galvin,%20G.%20J.&rft.date=1983-01-01&rft.volume=27&rft.issue=2&rft.spage=1079&rft.epage=1087&rft.pages=1079-1087&rft.issn=0163-1829&rft_id=info:doi/10.1103/PhysRevB.27.1079&rft_dat=%3Ccrossref%3E10_1103_PhysRevB_27_1079%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c268t-a9ff391a899ca0e32c3e236d36fd1c1d2c49cde4b84be15ebfaab8dae3bb5c583%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true