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Current transport and the fluctuation of critical current in high-temperature superconductor interface-engineered Josephson junctions

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2004-08, Vol.70 (5), p.054511.1-054511.14, Article 054511
Main Authors: YOSHIDA, Jiro, KATSUNO, Hiroshi, NAKAYAMA, Kohei, NAGANO, Toshihiko
Format: Article
Language:English
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ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.70.054511