Growth of ultrathin rare-earth films studied by in situ x-ray diffraction

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2004-12, Vol.70 (23), p.235413.1-235413.10, Article 235413
Main Authors: NICKLIN, C. L, EVERARD, M. J, NORRIS, C, BENNETT, S. L
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
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ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.70.235413