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Growth of ultrathin rare-earth films studied by in situ x-ray diffraction

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Published in:	Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2004-12, Vol.70 (23), p.235413.1-235413.10, Article 235413
Main Authors:	NICKLIN, C. L, EVERARD, M. J, NORRIS, C, BENNETT, S. L
Format:	Article
Language:	English
Subjects:	Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics
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source	American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list)
subjects	Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics
title	Growth of ultrathin rare-earth films studied by in situ x-ray diffraction
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