Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2007-02, Vol.75 (8), Article 085301
Main Authors: Trager-Cowan, C., Sweeney, F., Trimby, P. W., Day, A. P., Gholinia, A., Schmidt, N.-H., Parbrook, P. J., Wilkinson, A. J., Watson, I. M.
Format: Article
Language:English
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ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.75.085301