Characterizing the wetting of metallic thin films with angle-resolved photoelectron spectroscopy

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2010-08, Vol.82 (7), Article 075434
Main Authors: Luh, Dah-An, Liu, Kuan-Chun, Cheng, Cheng-Maw, Tsuei, Ku-Ding
Format: Article
Language:English
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ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.82.075434