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Spatially Resolved Dielectric Loss at the Si / SiO 2 Interface

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Bibliographic Details
Published in:Physical review letters 2024-06, Vol.132 (25), Article 256202
Main Authors: Cowie, Megan, Stock, Taylor J. Z., Constantinou, Procopios C., Curson, Neil J., Grütter, Peter
Format: Article
Language:English
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ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.132.256202