Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser Annealing

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Bibliographic Details
Published in:Physical review letters 1982-02, Vol.48 (5), p.337-340
Main Authors: Larson, B. C., White, C. W., Noggle, T. S., Mills, D.
Format: Article
Language:English
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ISSN:0031-9007
DOI:10.1103/PhysRevLett.48.337