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High-resolution electron-energy-loss spectroscopy of thin films of C_{60} on Si(100)
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Published in: | Physical review letters 1991-10, Vol.67 (16), p.2171-2174 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | eng ; jpn |
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cited_by | cdi_FETCH-LOGICAL-c1602-6f3c6887e6cac075530bdbb837d81272a0ea3d4873b0be249a2defd78fcd6b753 |
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cites | cdi_FETCH-LOGICAL-c1602-6f3c6887e6cac075530bdbb837d81272a0ea3d4873b0be249a2defd78fcd6b753 |
container_end_page | 2174 |
container_issue | 16 |
container_start_page | 2171 |
container_title | Physical review letters |
container_volume | 67 |
creator | Gensterblum, G. Pireaux, J. Thiry, P. Caudano, R. Vigneron, J. Lambin, Ph Lucas, A. Krätschmer, W. |
description | |
doi_str_mv | 10.1103/PhysRevLett.67.2171 |
format | article |
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identifier | ISSN: 0031-9007 |
ispartof | Physical review letters, 1991-10, Vol.67 (16), p.2171-2174 |
issn | 0031-9007 |
language | eng ; jpn |
recordid | cdi_crossref_primary_10_1103_PhysRevLett_67_2171 |
source | American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list) |
title | High-resolution electron-energy-loss spectroscopy of thin films of C_{60} on Si(100) |
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