Electric-field-induced structural changes measured with a CCD-coupled X-ray image intensifier

• Published in: Journal of applied crystallography 2000-12, Vol.33 (6), p.1422-1429
• Main Authors: Van Reeuwijk, S. J., Vonk, V., Puig-Molina, A., Graafsma, H.
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Physics; Single-crystal and powder diffraction; Structure of solids and liquids; crystallography; X-ray diffraction and scattering
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S0021889800013285

The conventional method to measure small induced changes in integrated intensity utilizes a zero‐dimensional detector, which greatly limits the data collection speed. This paper shows that the use of an area detector in combination with an X‐ray chopper decreases the data collection time significantly. A monochromatic diffraction setup using a charge‐coupled device (CCD) detector coupled to an X‐ray image intensifier was constructed and tested. The setup proved to be sufficiently stable to measure changes in integrated intensity well below 0.1%. Subsequently, a data set of a piezoelectric KD2PO4 crystal in an external electric field was collected. The data were merged to yield 77 unique reflections. The induced structural changes were determined by a least‐squares refinement. The results agree very well with experiments in which a zero‐dimensional detector was used. The major improvement is the decrease in data collection time by one order of magnitude, without any degradation of the data quality, offering new possibilities for this type of perturbation study.