Preparation of silver behenate coatings to provide low- to mid-angle diffraction calibration

A method for the preparation of a well aligned silver behenate sample is described. Multiple (0 0 l) diffraction peaks, (0 0 1) to (0 0 48), are easily observed using a conventional laboratory X‐ray diffraction instrument.

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Bibliographic Details
Published in:Journal of applied crystallography 2000-02, Vol.33 (1), p.172-173
Main Authors: Blanton, T. N., Barnes, C. L., Lelental, M.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Single-crystal and powder diffraction
Structure of solids and liquids
crystallography
X-ray diffraction and scattering
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Description
Summary:A method for the preparation of a well aligned silver behenate sample is described. Multiple (0 0 l) diffraction peaks, (0 0 1) to (0 0 48), are easily observed using a conventional laboratory X‐ray diffraction instrument.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889899012388