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Optimized spatial overlap in optical pump-X-ray probe experiments with high repetition rate using laser-induced surface distortions
Ultrafast X‐ray diffraction experiments require careful adjustment of the spatial overlap between the optical excitation and the X‐ray probe pulse. This is especially challenging at high laser repetition rates. Sample distortions caused by the large heat load on the sample and the relatively low opt...
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Published in: | Journal of synchrotron radiation 2016-03, Vol.23 (2), p.474-479 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Request full text |
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Summary: | Ultrafast X‐ray diffraction experiments require careful adjustment of the spatial overlap between the optical excitation and the X‐ray probe pulse. This is especially challenging at high laser repetition rates. Sample distortions caused by the large heat load on the sample and the relatively low optical energy per pulse lead to only tiny signal changes. In consequence, this results in small footprints of the optical excitation on the sample, which turns the adjustment of the overlap difficult. Here a method for reliable overlap adjustment based on reciprocal space mapping of a laser excited thin film is presented.
Problems and solutions for determining the spatial overlap in synchrotron‐based ultrafast X‐ray diffraction experiments are discussed. The method allows for the quantitative measurement of laser‐induced surface distortions in nanostructured solids. |
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ISSN: | 1600-5775 1600-5775 |
DOI: | 10.1107/S1600577515024443 |