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Simple step-stress model for an extension of the exponential distribution with type-I censoring
Purpose – The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution. Design/methodology/approach – The scale parameter of the distribution is assumed to be a log-linear function of the stress and a...
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Published in: | The International journal of quality & reliability management 2015-09, Vol.32 (8), p.906-920 |
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cites | cdi_FETCH-LOGICAL-c381t-181aa6d0f738721c8ed68dd1682e4c74ea4e8391386f60e01b265c6513491c273 |
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container_title | The International journal of quality & reliability management |
container_volume | 32 |
creator | Haghighi, Firoozeh |
description | Purpose
– The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution.
Design/methodology/approach
– The scale parameter of the distribution is assumed to be a log-linear function of the stress and a cumulative exposure model is hold. The maximum likelihood estimates of the parameters, as well as the corresponding Fisher information matrix are derived. Two real examples are given to show the application of an extension of the exponential distribution in reliability studies and a numerical example is presented to illustrate the method discussed here.
Findings
– A simple step-stress test under cumulative exposure model and type-I censoring for an extension of the exponential distribution is presented.
Originality/value
– The work is original. |
doi_str_mv | 10.1108/IJQRM-05-2015-0081 |
format | article |
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– The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution.
Design/methodology/approach
– The scale parameter of the distribution is assumed to be a log-linear function of the stress and a cumulative exposure model is hold. The maximum likelihood estimates of the parameters, as well as the corresponding Fisher information matrix are derived. Two real examples are given to show the application of an extension of the exponential distribution in reliability studies and a numerical example is presented to illustrate the method discussed here.
Findings
– A simple step-stress test under cumulative exposure model and type-I censoring for an extension of the exponential distribution is presented.
Originality/value
– The work is original.</description><identifier>ISSN: 0265-671X</identifier><identifier>EISSN: 1758-6682</identifier><identifier>DOI: 10.1108/IJQRM-05-2015-0081</identifier><language>eng</language><publisher>Bradford: Emerald Group Publishing Limited</publisher><subject>Accelerated life tests ; Economic models ; Expected values ; Exposure ; Failure ; Failure times ; Management ; Management science & operations ; Mathematical analysis ; Mathematical models ; Probability distribution functions ; Product life cycle ; Quality control & reliability ; Quality management/systems ; Reliability analysis ; Scale (ratio) ; Stress ; Stress concentration</subject><ispartof>The International journal of quality & reliability management, 2015-09, Vol.32 (8), p.906-920</ispartof><rights>Emerald Group Publishing Limited</rights><rights>Emerald Group Publishing Limited 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-181aa6d0f738721c8ed68dd1682e4c74ea4e8391386f60e01b265c6513491c273</citedby><cites>FETCH-LOGICAL-c381t-181aa6d0f738721c8ed68dd1682e4c74ea4e8391386f60e01b265c6513491c273</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/1706970174?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,776,780,11668,27903,27904,36039,36040,44342</link.rule.ids></links><search><creatorcontrib>Haghighi, Firoozeh</creatorcontrib><title>Simple step-stress model for an extension of the exponential distribution with type-I censoring</title><title>The International journal of quality & reliability management</title><description>Purpose
– The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution.
Design/methodology/approach
– The scale parameter of the distribution is assumed to be a log-linear function of the stress and a cumulative exposure model is hold. The maximum likelihood estimates of the parameters, as well as the corresponding Fisher information matrix are derived. Two real examples are given to show the application of an extension of the exponential distribution in reliability studies and a numerical example is presented to illustrate the method discussed here.
Findings
– A simple step-stress test under cumulative exposure model and type-I censoring for an extension of the exponential distribution is presented.
Originality/value
– The work is original.</description><subject>Accelerated life tests</subject><subject>Economic models</subject><subject>Expected values</subject><subject>Exposure</subject><subject>Failure</subject><subject>Failure times</subject><subject>Management</subject><subject>Management science & operations</subject><subject>Mathematical analysis</subject><subject>Mathematical models</subject><subject>Probability distribution functions</subject><subject>Product life cycle</subject><subject>Quality control & reliability</subject><subject>Quality management/systems</subject><subject>Reliability analysis</subject><subject>Scale (ratio)</subject><subject>Stress</subject><subject>Stress 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Limited</general><scope>AAYXX</scope><scope>CITATION</scope><scope>0U~</scope><scope>1-H</scope><scope>7TA</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>8AO</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FI</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>F~G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K6~</scope><scope>K8~</scope><scope>L.-</scope><scope>L.0</scope><scope>L6V</scope><scope>M0C</scope><scope>M0T</scope><scope>M2T</scope><scope>M7S</scope><scope>PQBIZ</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope></search><sort><creationdate>20150907</creationdate><title>Simple step-stress model for an extension of the exponential distribution with type-I censoring</title><author>Haghighi, Firoozeh</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-181aa6d0f738721c8ed68dd1682e4c74ea4e8391386f60e01b265c6513491c273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Accelerated life tests</topic><topic>Economic models</topic><topic>Expected values</topic><topic>Exposure</topic><topic>Failure</topic><topic>Failure times</topic><topic>Management</topic><topic>Management science & operations</topic><topic>Mathematical analysis</topic><topic>Mathematical models</topic><topic>Probability distribution functions</topic><topic>Product life cycle</topic><topic>Quality control & reliability</topic><topic>Quality management/systems</topic><topic>Reliability analysis</topic><topic>Scale (ratio)</topic><topic>Stress</topic><topic>Stress concentration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Haghighi, Firoozeh</creatorcontrib><collection>CrossRef</collection><collection>Global News & ABI/Inform Professional</collection><collection>Trade PRO</collection><collection>Materials Business File</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ProQuest Pharma Collection</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Hospital Premium Collection</collection><collection>Materials Science & Engineering Database (Proquest)</collection><collection>ProQuest Central</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>ProQuest Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest 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collection</collection><collection>ProQuest Central Basic</collection><jtitle>The International journal of quality & reliability management</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Haghighi, Firoozeh</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simple step-stress model for an extension of the exponential distribution with type-I censoring</atitle><jtitle>The International journal of quality & reliability management</jtitle><date>2015-09-07</date><risdate>2015</risdate><volume>32</volume><issue>8</issue><spage>906</spage><epage>920</epage><pages>906-920</pages><issn>0265-671X</issn><eissn>1758-6682</eissn><abstract>Purpose
– The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution.
Design/methodology/approach
– The scale parameter of the distribution is assumed to be a log-linear function of the stress and a cumulative exposure model is hold. The maximum likelihood estimates of the parameters, as well as the corresponding Fisher information matrix are derived. Two real examples are given to show the application of an extension of the exponential distribution in reliability studies and a numerical example is presented to illustrate the method discussed here.
Findings
– A simple step-stress test under cumulative exposure model and type-I censoring for an extension of the exponential distribution is presented.
Originality/value
– The work is original.</abstract><cop>Bradford</cop><pub>Emerald Group Publishing Limited</pub><doi>10.1108/IJQRM-05-2015-0081</doi><tpages>15</tpages></addata></record> |
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source | ABI/INFORM Global; Emerald:Jisc Collections:Emerald Subject Collections HE and FE 2024-2026:Emerald Premier (reading list) |
subjects | Accelerated life tests Economic models Expected values Exposure Failure Failure times Management Management science & operations Mathematical analysis Mathematical models Probability distribution functions Product life cycle Quality control & reliability Quality management/systems Reliability analysis Scale (ratio) Stress Stress concentration |
title | Simple step-stress model for an extension of the exponential distribution with type-I censoring |
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