Numerical and experimental corroboration of an FDTD thin-slot model for slots near corners of shielding enclosures

Simple design maxims to restrict slot dimensions in enclosure designs below a half-wave length are not always adequate for minimizing electromagnetic interference (EMI). Complex interactions between cavity modes, sources, and slots can result in appreciable radiation through nonresonant length slots...

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Bibliographic Details
Published in:IEEE transactions on electromagnetic compatibility 1997-08, Vol.39 (3), p.225-232
Main Authors: Min Li, Kuang-Ping Ma, Hockanson, D.M., Drewniak, J.L., Hubing, T.H., Van Doren, T.P.
Format: Article
Language:English
Subjects:
Apertures
Applied classical electromagnetism
Capacitance
Coupling circuits
Dielectric constant
Electromagnetic interference
Electromagnetic modeling
Electromagnetism
electron and ion optics
Exact sciences and technology
Finite difference methods
Fundamental areas of phenomenology (including applications)
Magnetostatics
magnetic shielding, magnetic induction, boundary-value problems
Moment methods
Numerical models
Physics
Time domain analysis
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Summary:Simple design maxims to restrict slot dimensions in enclosure designs below a half-wave length are not always adequate for minimizing electromagnetic interference (EMI). Complex interactions between cavity modes, sources, and slots can result in appreciable radiation through nonresonant length slots. The finite-difference time domain (FDTD) method can be employed to pursue these issues with adequate modeling of thin slots. Subcellular FDTD algorithms for modeling thin slots in conductors have previously been developed. One algorithm based on a quasistatic approximation has been shown to agree well with experimental results for thin slots in planes. This FDTD thin-slot algorithm is compared herein with two-dimensional (2-D) moment method results for thin slots near corners and plane wave excitation. FDTD simulations are also compared with measurements for slots near an edge of a cavity with an internal source.
ISSN:0018-9375
1558-187X
DOI:10.1109/15.618050