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Noise correlation in dual-collector magnetotransistors
Experimental results of low frequency (1/f) noise in magnetic-field-sensitive dual-collector bipolar transistors are presented that show a strong positive correlation between the noise voltages (converted from corresponding fluctuations in the currents) of the collectors. Hence, operating the magnet...
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Published in: | IEEE transactions on electron devices 1989-06, Vol.36 (6), p.1073-1075 |
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container_end_page | 1075 |
container_issue | 6 |
container_start_page | 1073 |
container_title | IEEE transactions on electron devices |
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creator | Nathan, A. Baltes, H.P. Briglio, D.R. Doan, M.T. |
description | Experimental results of low frequency (1/f) noise in magnetic-field-sensitive dual-collector bipolar transistors are presented that show a strong positive correlation between the noise voltages (converted from corresponding fluctuations in the currents) of the collectors. Hence, operating the magnetotransistor in a differential mode yields very favorable signal-to-noise ratios, even for low magnetic sensitivity. Calculations performed for a magnetotransistor with a sensitivity of only 0.06/T yields a field resolution of 25 nT/ square root Hz at 1 kHz, in contrast to 14 mu T/ square root Hz in single-ended operation.< > |
doi_str_mv | 10.1109/16.24350 |
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Hence, operating the magnetotransistor in a differential mode yields very favorable signal-to-noise ratios, even for low magnetic sensitivity. Calculations performed for a magnetotransistor with a sensitivity of only 0.06/T yields a field resolution of 25 nT/ square root Hz at 1 kHz, in contrast to 14 mu T/ square root Hz in single-ended operation.< ></description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.24350</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Bipolar transistors ; CMOS technology ; Electronics ; Exact sciences and technology ; Fluctuations ; Frequency conversion ; Low-frequency noise ; Magnetic field measurement ; Magnetic noise ; Noise reduction ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Signal to noise ratio ; Transistors ; Voltage</subject><ispartof>IEEE transactions on electron devices, 1989-06, Vol.36 (6), p.1073-1075</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c304t-447dc668b6c7dfc19de495e10f554ddcae167380dda1693a98c894a8b0bf96b73</citedby><cites>FETCH-LOGICAL-c304t-447dc668b6c7dfc19de495e10f554ddcae167380dda1693a98c894a8b0bf96b73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/24350$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19673418$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Nathan, A.</creatorcontrib><creatorcontrib>Baltes, H.P.</creatorcontrib><creatorcontrib>Briglio, D.R.</creatorcontrib><creatorcontrib>Doan, M.T.</creatorcontrib><title>Noise correlation in dual-collector magnetotransistors</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>Experimental results of low frequency (1/f) noise in magnetic-field-sensitive dual-collector bipolar transistors are presented that show a strong positive correlation between the noise voltages (converted from corresponding fluctuations in the currents) of the collectors. Hence, operating the magnetotransistor in a differential mode yields very favorable signal-to-noise ratios, even for low magnetic sensitivity. Calculations performed for a magnetotransistor with a sensitivity of only 0.06/T yields a field resolution of 25 nT/ square root Hz at 1 kHz, in contrast to 14 mu T/ square root Hz in single-ended operation.< ></description><subject>Applied sciences</subject><subject>Bipolar transistors</subject><subject>CMOS technology</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fluctuations</subject><subject>Frequency conversion</subject><subject>Low-frequency noise</subject><subject>Magnetic field measurement</subject><subject>Magnetic noise</subject><subject>Noise reduction</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Signal to noise ratio</subject><subject>Transistors</subject><subject>Voltage</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEQhoMoWKvg1dteFC9bkyabTY5S_IKiFz2HbDIrkXRTM9uD_97oFj0NM_PwMPMScs7ogjGqb5hcLAVv6AGZsaZpay2FPCQzSpmqNVf8mJwgfpRWCrGcEfmcAkLlUs4Q7RjSUIWh8jsba5diBDemXG3s-wBjGrMdMGCZ4Ck56m1EONvXOXm7v3tdPdbrl4en1e26dpyKsRai9U5K1UnX-t4x7UHoBhjtm0Z47yww2XJFvbdMam61ckoLqzra9Vp2LZ-Tq8m7zelzBziaTUAHMdoB0g7NsuG85VwX8HoCXU6IGXqzzWFj85dh1PwEY5g0v8EU9HLvtOhs7MtXLuA_r8tJgqnCXUxcAIC_9eT4Bj_Daoc</recordid><startdate>19890601</startdate><enddate>19890601</enddate><creator>Nathan, A.</creator><creator>Baltes, H.P.</creator><creator>Briglio, D.R.</creator><creator>Doan, M.T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19890601</creationdate><title>Noise correlation in dual-collector magnetotransistors</title><author>Nathan, A. ; Baltes, H.P. ; Briglio, D.R. ; Doan, M.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c304t-447dc668b6c7dfc19de495e10f554ddcae167380dda1693a98c894a8b0bf96b73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><topic>Applied sciences</topic><topic>Bipolar transistors</topic><topic>CMOS technology</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fluctuations</topic><topic>Frequency conversion</topic><topic>Low-frequency noise</topic><topic>Magnetic field measurement</topic><topic>Magnetic noise</topic><topic>Noise reduction</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Signal to noise ratio</topic><topic>Transistors</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nathan, A.</creatorcontrib><creatorcontrib>Baltes, H.P.</creatorcontrib><creatorcontrib>Briglio, D.R.</creatorcontrib><creatorcontrib>Doan, M.T.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nathan, A.</au><au>Baltes, H.P.</au><au>Briglio, D.R.</au><au>Doan, M.T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Noise correlation in dual-collector magnetotransistors</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1989-06-01</date><risdate>1989</risdate><volume>36</volume><issue>6</issue><spage>1073</spage><epage>1075</epage><pages>1073-1075</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Experimental results of low frequency (1/f) noise in magnetic-field-sensitive dual-collector bipolar transistors are presented that show a strong positive correlation between the noise voltages (converted from corresponding fluctuations in the currents) of the collectors. Hence, operating the magnetotransistor in a differential mode yields very favorable signal-to-noise ratios, even for low magnetic sensitivity. Calculations performed for a magnetotransistor with a sensitivity of only 0.06/T yields a field resolution of 25 nT/ square root Hz at 1 kHz, in contrast to 14 mu T/ square root Hz in single-ended operation.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/16.24350</doi><tpages>3</tpages></addata></record> |
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subjects | Applied sciences Bipolar transistors CMOS technology Electronics Exact sciences and technology Fluctuations Frequency conversion Low-frequency noise Magnetic field measurement Magnetic noise Noise reduction Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal to noise ratio Transistors Voltage |
title | Noise correlation in dual-collector magnetotransistors |
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