A new symbolic method for analog circuit testability evaluation

Testability is a very useful concept in the field of circuit testing and fault diagnosis and can be defined as a measure of the effectiveness of a selected test point set. A very efficient approach for automated testability evaluation of analog circuits is based on the use of symbolic techniques. Di...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1998-04, Vol.47 (2), p.554-565
Main Authors: Fedi, G., Luchetta, A., Manetti, S., Piccirilli, M.C.
Format: Article
Language:English
Subjects:
Analog circuits
Automatic testing
Circuit faults
Circuit testing
Design engineering
Fault diagnosis
Fault location
Nonlinear equations
Roundoff errors
System testing
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Testability is a very useful concept in the field of circuit testing and fault diagnosis and can be defined as a measure of the effectiveness of a selected test point set. A very efficient approach for automated testability evaluation of analog circuits is based on the use of symbolic techniques. Different algorithms relying on the symbolic approach have been presented in the past by the authors and in this work noteworthy improvements on these algorithms are proposed. The new theoretical approach and the description of the subsequent algorithm that optimizes the testability evaluation from a computational point of view are presented. As a result, in the computer implementation the roundoff errors are completely eliminated and the computing speed is increased. The program which implements this new algorithm is also presented.
ISSN:0018-9456
1557-9662
DOI:10.1109/19.744205