Loading…
Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates
The properties of DC SQUIDs made of YBCO thin film deposited on ZrO/sub 2/ bicrystal substrate and the nature of the fabricated Josephson junctions have been studied. It is found that the characteristics of the junctions are similar to those of the SNS structures with paramagnetic impurities in the...
Saved in:
Published in: | IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1991-03, Vol.27 (2), p.2442-2445 |
---|---|
Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3 |
---|---|
cites | cdi_FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3 |
container_end_page | 2445 |
container_issue | 2 |
container_start_page | 2442 |
container_title | IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) |
container_volume | 27 |
creator | Kovalev, A.S. Krasnosvobotsev, S.I. Kuprijanov, M.Yu Maresov, A.G. Ozerenko, A.A. Pechen, E.V. Pirogov, V.G. Pogosova, I.S. Snigirev, O.V. Vengrus, I.I. |
description | The properties of DC SQUIDs made of YBCO thin film deposited on ZrO/sub 2/ bicrystal substrate and the nature of the fabricated Josephson junctions have been studied. It is found that the characteristics of the junctions are similar to those of the SNS structures with paramagnetic impurities in the N layer. A level of interferometer noise close to 5*10/sup -4/ Phi /sub 0//Hz/sup 1/2/ and a magnetic field sensitivity of 10/sup -10/ T/Hz/sup 1/2/ at frequencies higher than 25 Hz in the usual feedback mode of the SQUID operation have been achieved at 77 K. |
doi_str_mv | 10.1109/20.133712 |
format | article |
fullrecord | <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_crossref_primary_10_1109_20_133712</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>133712</ieee_id><sourcerecordid>10_1109_20_133712</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3</originalsourceid><addsrcrecordid>eNpFkD1PwzAQhi0EEqUwsDJZbAyhPtsJ8QhV-ZAqlQEGGIiSy1k1auPKNkP_PYYgMT3v3T264WXsHMQ1gDAzmanUDcgDNgGjoRCiModsIgTUhdGVPmYnMX7mUZcgJuzjOfgdheQocm95WhN_u5uvcnADt26z5W5IFCwFv6UcIrdtFxy2iXruB_4eVrP41XE5453DsI-p3fC8iClkJZ6yI9tuIp39ccpe7xcv88diuXp4mt8uCwQpdFEBoEWNJEpb11YhQaeVaVGZTmpDUAnEbPRYWmNVq0zV9wi1LIVSQnVqyi7Hvz4m10R0iXCNfhgIU1OJ2kils3Q1Shh8jIFsswtu24Z9A6L5aa-Rmb_tZfdidB0R_Xvj8RvAI2oY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Kovalev, A.S. ; Krasnosvobotsev, S.I. ; Kuprijanov, M.Yu ; Maresov, A.G. ; Ozerenko, A.A. ; Pechen, E.V. ; Pirogov, V.G. ; Pogosova, I.S. ; Snigirev, O.V. ; Vengrus, I.I.</creator><creatorcontrib>Kovalev, A.S. ; Krasnosvobotsev, S.I. ; Kuprijanov, M.Yu ; Maresov, A.G. ; Ozerenko, A.A. ; Pechen, E.V. ; Pirogov, V.G. ; Pogosova, I.S. ; Snigirev, O.V. ; Vengrus, I.I.</creatorcontrib><description>The properties of DC SQUIDs made of YBCO thin film deposited on ZrO/sub 2/ bicrystal substrate and the nature of the fabricated Josephson junctions have been studied. It is found that the characteristics of the junctions are similar to those of the SNS structures with paramagnetic impurities in the N layer. A level of interferometer noise close to 5*10/sup -4/ Phi /sub 0//Hz/sup 1/2/ and a magnetic field sensitivity of 10/sup -10/ T/Hz/sup 1/2/ at frequencies higher than 25 Hz in the usual feedback mode of the SQUID operation have been achieved at 77 K.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.133712</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>United States: IEEE</publisher><subject>360201 -- Ceramics, Cermets, & Refractories-- Preparation & Fabrication ; 440800 -- Miscellaneous Instrumentation-- (1990-) ; ALKALINE EARTH METAL COMPOUNDS ; BARIUM COMPOUNDS ; BARIUM OXIDES ; BICRYSTALS ; CHALCOGENIDES ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; COPPER COMPOUNDS ; COPPER OXIDES ; CRYSTALS ; ELECTRICAL PROPERTIES ; ELECTRONIC EQUIPMENT ; FABRICATION ; FLUXMETERS ; Impurities ; INTERFEROMETERS ; JOSEPHSON JUNCTIONS ; JUNCTIONS ; MAGNETIC FIELDS ; Magnetic noise ; MAGNETISM ; MATERIALS SCIENCE ; MEASURING INSTRUMENTS ; MICROWAVE EQUIPMENT ; OTHER INSTRUMENTATION ; OXIDES ; OXYGEN COMPOUNDS ; Paramagnetic materials ; PARAMAGNETISM ; PHYSICAL PROPERTIES ; POLYCRYSTALS ; SENSITIVITY ; Sputtering ; SQUID DEVICES ; SQUIDs ; SUBSTRATES ; SUPERCONDUCTING DEVICES ; SUPERCONDUCTING JUNCTIONS ; THIN FILMS ; Transistors ; TRANSITION ELEMENT COMPOUNDS ; Yttrium barium copper oxide ; YTTRIUM COMPOUNDS ; YTTRIUM OXIDES ; ZIRCONIUM COMPOUNDS 665412 -- Superconducting Devices-- (1992-) ; ZIRCONIUM OXIDES</subject><ispartof>IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), 1991-03, Vol.27 (2), p.2442-2445</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3</citedby><cites>FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/133712$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,309,310,314,780,784,789,790,885,23930,23931,25140,27924,27925,54796</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/6089234$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Kovalev, A.S.</creatorcontrib><creatorcontrib>Krasnosvobotsev, S.I.</creatorcontrib><creatorcontrib>Kuprijanov, M.Yu</creatorcontrib><creatorcontrib>Maresov, A.G.</creatorcontrib><creatorcontrib>Ozerenko, A.A.</creatorcontrib><creatorcontrib>Pechen, E.V.</creatorcontrib><creatorcontrib>Pirogov, V.G.</creatorcontrib><creatorcontrib>Pogosova, I.S.</creatorcontrib><creatorcontrib>Snigirev, O.V.</creatorcontrib><creatorcontrib>Vengrus, I.I.</creatorcontrib><title>Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates</title><title>IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)</title><addtitle>TMAG</addtitle><description>The properties of DC SQUIDs made of YBCO thin film deposited on ZrO/sub 2/ bicrystal substrate and the nature of the fabricated Josephson junctions have been studied. It is found that the characteristics of the junctions are similar to those of the SNS structures with paramagnetic impurities in the N layer. A level of interferometer noise close to 5*10/sup -4/ Phi /sub 0//Hz/sup 1/2/ and a magnetic field sensitivity of 10/sup -10/ T/Hz/sup 1/2/ at frequencies higher than 25 Hz in the usual feedback mode of the SQUID operation have been achieved at 77 K.</description><subject>360201 -- Ceramics, Cermets, & Refractories-- Preparation & Fabrication</subject><subject>440800 -- Miscellaneous Instrumentation-- (1990-)</subject><subject>ALKALINE EARTH METAL COMPOUNDS</subject><subject>BARIUM COMPOUNDS</subject><subject>BARIUM OXIDES</subject><subject>BICRYSTALS</subject><subject>CHALCOGENIDES</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>COPPER COMPOUNDS</subject><subject>COPPER OXIDES</subject><subject>CRYSTALS</subject><subject>ELECTRICAL PROPERTIES</subject><subject>ELECTRONIC EQUIPMENT</subject><subject>FABRICATION</subject><subject>FLUXMETERS</subject><subject>Impurities</subject><subject>INTERFEROMETERS</subject><subject>JOSEPHSON JUNCTIONS</subject><subject>JUNCTIONS</subject><subject>MAGNETIC FIELDS</subject><subject>Magnetic noise</subject><subject>MAGNETISM</subject><subject>MATERIALS SCIENCE</subject><subject>MEASURING INSTRUMENTS</subject><subject>MICROWAVE EQUIPMENT</subject><subject>OTHER INSTRUMENTATION</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>Paramagnetic materials</subject><subject>PARAMAGNETISM</subject><subject>PHYSICAL PROPERTIES</subject><subject>POLYCRYSTALS</subject><subject>SENSITIVITY</subject><subject>Sputtering</subject><subject>SQUID DEVICES</subject><subject>SQUIDs</subject><subject>SUBSTRATES</subject><subject>SUPERCONDUCTING DEVICES</subject><subject>SUPERCONDUCTING JUNCTIONS</subject><subject>THIN FILMS</subject><subject>Transistors</subject><subject>TRANSITION ELEMENT COMPOUNDS</subject><subject>Yttrium barium copper oxide</subject><subject>YTTRIUM COMPOUNDS</subject><subject>YTTRIUM OXIDES</subject><subject>ZIRCONIUM COMPOUNDS 665412 -- Superconducting Devices-- (1992-)</subject><subject>ZIRCONIUM OXIDES</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNpFkD1PwzAQhi0EEqUwsDJZbAyhPtsJ8QhV-ZAqlQEGGIiSy1k1auPKNkP_PYYgMT3v3T264WXsHMQ1gDAzmanUDcgDNgGjoRCiModsIgTUhdGVPmYnMX7mUZcgJuzjOfgdheQocm95WhN_u5uvcnADt26z5W5IFCwFv6UcIrdtFxy2iXruB_4eVrP41XE5453DsI-p3fC8iClkJZ6yI9tuIp39ccpe7xcv88diuXp4mt8uCwQpdFEBoEWNJEpb11YhQaeVaVGZTmpDUAnEbPRYWmNVq0zV9wi1LIVSQnVqyi7Hvz4m10R0iXCNfhgIU1OJ2kils3Q1Shh8jIFsswtu24Z9A6L5aa-Rmb_tZfdidB0R_Xvj8RvAI2oY</recordid><startdate>199103</startdate><enddate>199103</enddate><creator>Kovalev, A.S.</creator><creator>Krasnosvobotsev, S.I.</creator><creator>Kuprijanov, M.Yu</creator><creator>Maresov, A.G.</creator><creator>Ozerenko, A.A.</creator><creator>Pechen, E.V.</creator><creator>Pirogov, V.G.</creator><creator>Pogosova, I.S.</creator><creator>Snigirev, O.V.</creator><creator>Vengrus, I.I.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>199103</creationdate><title>Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates</title><author>Kovalev, A.S. ; Krasnosvobotsev, S.I. ; Kuprijanov, M.Yu ; Maresov, A.G. ; Ozerenko, A.A. ; Pechen, E.V. ; Pirogov, V.G. ; Pogosova, I.S. ; Snigirev, O.V. ; Vengrus, I.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>360201 -- Ceramics, Cermets, & Refractories-- Preparation & Fabrication</topic><topic>440800 -- Miscellaneous Instrumentation-- (1990-)</topic><topic>ALKALINE EARTH METAL COMPOUNDS</topic><topic>BARIUM COMPOUNDS</topic><topic>BARIUM OXIDES</topic><topic>BICRYSTALS</topic><topic>CHALCOGENIDES</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>COPPER COMPOUNDS</topic><topic>COPPER OXIDES</topic><topic>CRYSTALS</topic><topic>ELECTRICAL PROPERTIES</topic><topic>ELECTRONIC EQUIPMENT</topic><topic>FABRICATION</topic><topic>FLUXMETERS</topic><topic>Impurities</topic><topic>INTERFEROMETERS</topic><topic>JOSEPHSON JUNCTIONS</topic><topic>JUNCTIONS</topic><topic>MAGNETIC FIELDS</topic><topic>Magnetic noise</topic><topic>MAGNETISM</topic><topic>MATERIALS SCIENCE</topic><topic>MEASURING INSTRUMENTS</topic><topic>MICROWAVE EQUIPMENT</topic><topic>OTHER INSTRUMENTATION</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>Paramagnetic materials</topic><topic>PARAMAGNETISM</topic><topic>PHYSICAL PROPERTIES</topic><topic>POLYCRYSTALS</topic><topic>SENSITIVITY</topic><topic>Sputtering</topic><topic>SQUID DEVICES</topic><topic>SQUIDs</topic><topic>SUBSTRATES</topic><topic>SUPERCONDUCTING DEVICES</topic><topic>SUPERCONDUCTING JUNCTIONS</topic><topic>THIN FILMS</topic><topic>Transistors</topic><topic>TRANSITION ELEMENT COMPOUNDS</topic><topic>Yttrium barium copper oxide</topic><topic>YTTRIUM COMPOUNDS</topic><topic>YTTRIUM OXIDES</topic><topic>ZIRCONIUM COMPOUNDS 665412 -- Superconducting Devices-- (1992-)</topic><topic>ZIRCONIUM OXIDES</topic><toplevel>online_resources</toplevel><creatorcontrib>Kovalev, A.S.</creatorcontrib><creatorcontrib>Krasnosvobotsev, S.I.</creatorcontrib><creatorcontrib>Kuprijanov, M.Yu</creatorcontrib><creatorcontrib>Maresov, A.G.</creatorcontrib><creatorcontrib>Ozerenko, A.A.</creatorcontrib><creatorcontrib>Pechen, E.V.</creatorcontrib><creatorcontrib>Pirogov, V.G.</creatorcontrib><creatorcontrib>Pogosova, I.S.</creatorcontrib><creatorcontrib>Snigirev, O.V.</creatorcontrib><creatorcontrib>Vengrus, I.I.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kovalev, A.S.</au><au>Krasnosvobotsev, S.I.</au><au>Kuprijanov, M.Yu</au><au>Maresov, A.G.</au><au>Ozerenko, A.A.</au><au>Pechen, E.V.</au><au>Pirogov, V.G.</au><au>Pogosova, I.S.</au><au>Snigirev, O.V.</au><au>Vengrus, I.I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates</atitle><jtitle>IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)</jtitle><stitle>TMAG</stitle><date>1991-03</date><risdate>1991</risdate><volume>27</volume><issue>2</issue><spage>2442</spage><epage>2445</epage><pages>2442-2445</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>The properties of DC SQUIDs made of YBCO thin film deposited on ZrO/sub 2/ bicrystal substrate and the nature of the fabricated Josephson junctions have been studied. It is found that the characteristics of the junctions are similar to those of the SNS structures with paramagnetic impurities in the N layer. A level of interferometer noise close to 5*10/sup -4/ Phi /sub 0//Hz/sup 1/2/ and a magnetic field sensitivity of 10/sup -10/ T/Hz/sup 1/2/ at frequencies higher than 25 Hz in the usual feedback mode of the SQUID operation have been achieved at 77 K.</abstract><cop>United States</cop><pub>IEEE</pub><doi>10.1109/20.133712</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9464 |
ispartof | IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), 1991-03, Vol.27 (2), p.2442-2445 |
issn | 0018-9464 1941-0069 |
language | eng |
recordid | cdi_crossref_primary_10_1109_20_133712 |
source | IEEE Electronic Library (IEL) Journals |
subjects | 360201 -- Ceramics, Cermets, & Refractories-- Preparation & Fabrication 440800 -- Miscellaneous Instrumentation-- (1990-) ALKALINE EARTH METAL COMPOUNDS BARIUM COMPOUNDS BARIUM OXIDES BICRYSTALS CHALCOGENIDES CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY COPPER COMPOUNDS COPPER OXIDES CRYSTALS ELECTRICAL PROPERTIES ELECTRONIC EQUIPMENT FABRICATION FLUXMETERS Impurities INTERFEROMETERS JOSEPHSON JUNCTIONS JUNCTIONS MAGNETIC FIELDS Magnetic noise MAGNETISM MATERIALS SCIENCE MEASURING INSTRUMENTS MICROWAVE EQUIPMENT OTHER INSTRUMENTATION OXIDES OXYGEN COMPOUNDS Paramagnetic materials PARAMAGNETISM PHYSICAL PROPERTIES POLYCRYSTALS SENSITIVITY Sputtering SQUID DEVICES SQUIDs SUBSTRATES SUPERCONDUCTING DEVICES SUPERCONDUCTING JUNCTIONS THIN FILMS Transistors TRANSITION ELEMENT COMPOUNDS Yttrium barium copper oxide YTTRIUM COMPOUNDS YTTRIUM OXIDES ZIRCONIUM COMPOUNDS 665412 -- Superconducting Devices-- (1992-) ZIRCONIUM OXIDES |
title | Properties of the YBCO thin film interferometers fabricated on ZrO/sub 2/ bicrystal substrates |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T18%3A21%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Properties%20of%20the%20YBCO%20thin%20film%20interferometers%20fabricated%20on%20ZrO/sub%202/%20bicrystal%20substrates&rft.jtitle=IEEE%20Transactions%20on%20Magnetics%20(Institute%20of%20Electrical%20and%20Electronics%20Engineers);%20(United%20States)&rft.au=Kovalev,%20A.S.&rft.date=1991-03&rft.volume=27&rft.issue=2&rft.spage=2442&rft.epage=2445&rft.pages=2442-2445&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/20.133712&rft_dat=%3Ccrossref_ieee_%3E10_1109_20_133712%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c1204-611cfc4ce05f88f3ce1b439ac39b249e160cccfcdc5f9f3a396ddc182503303b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=133712&rfr_iscdi=true |