A general approach to network analyzer calibration

• Published in: IEEE transactions on microwave theory and techniques 1992-04, Vol.40 (4), p.754-759
• Main Author: Silvonen, K.J.
• Format: Article
• Language: English
• Subjects: Applied sciences; Attenuation; Calibration; Circuit properties; Circuits; Delay lines; Electric, optical and optoelectronic circuits; Electronics; Equations; Exact sciences and technology; Filtering theory; Fixtures; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Reflection; Scattering parameters; Testing
• ISSN: 0018-9480; 1557-9670
• DOI: 10.1109/22.127526

A general-purpose algorithm, the TCX algorithm, for network analyzer and test fixture calibration is presented. The algorithm can handle most of the existing calibration methods, including symmetrical test fixtures. Any combination of one-port or two-port standards can be used. There is a possibility of partial self-calibration, if one of the standards is a two-port network or a through connection. The algorithm is applied to get simple equations covering the TSD, LDX (LRL), LAX, and LMX methods (X being an unknown one-port or symmetrical two-port network). A transmission path is allowed between the ports of standard X. In the TSD method, the delay line can be replaced with an attenuation network or with a matched load; also, the through line can have an unknown delay line and attenuation. A method of root choice for LRL and similar methods in conjunction with test fixtures is described. The method of least-squares-fit can be applied, when redundant data are available. It gives an essential improvement of accuracy in the simulation of a symmetrical test fixture.< >