An ultra-high precision benchmark for validation of planar electromagnetic analyses

A stripline standard is applied to the validation of planar electromagnetic analysis. Since an exact theoretical expression is available for stripline, a benchmark can be specified to the accuracy to which the expressions can be evaluated. Data for the benchmark accurate to about 10/sup -8/ is provi...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1994-11, Vol.42 (11), p.2046-2050
Main Author: Rautio, J.C.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Convergence
Electric, optical and optoelectronic circuits
Electromagnetic analysis
Electromagnetic measurements
Electronics
Error analysis
Error correction
Exact sciences and technology
Impedance
Inspection
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Microwave propagation
Scattering parameters
Stripline
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Summary:A stripline standard is applied to the validation of planar electromagnetic analysis. Since an exact theoretical expression is available for stripline, a benchmark can be specified to the accuracy to which the expressions can be evaluated. Data for the benchmark accurate to about 10/sup -8/ is provided. A definition for an error metric appropriate for use with the benchmark is illustrated. A means of calculating a precise value of analysis error using the error metric is described. A first order numerical value for the residual analysis error can also be obtained from the calculated S-parameters by inspection. The benchmark can be applied to any planar electromagnetic analysis capable of analyzing stripline. Example results, illustrating absolute convergence of an analysis to 0.05%, are provided.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.330117