Measurement of X-ray spectrum using a small size CdTe multichannel detector

A multichannel detector was fabricated with 32 elements, each 1 mm wide*0.25 mm long*0.3 mm thick, on a single CdTe crystal wafer whose overall size was 1*8*0.3 mm. One of the elements was subjected to an energy analysis using diagnostic wavelength X-rays. It is noted that the energy spectrum was di...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1992-12, Vol.39 (6), p.2282-2285
Main Authors: Tsutsui, H., Ohtsuchi, T., Ohmori, K., Baba, S.
Format: Article
Language:English
Subjects:
Calibration
Curve fitting
Electromagnetic wave absorption
Error correction
Gamma ray detection
Gamma ray detectors
Size measurement
Wavelength measurement
X-ray detection
X-ray detectors
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Summary:A multichannel detector was fabricated with 32 elements, each 1 mm wide*0.25 mm long*0.3 mm thick, on a single CdTe crystal wafer whose overall size was 1*8*0.3 mm. One of the elements was subjected to an energy analysis using diagnostic wavelength X-rays. It is noted that the energy spectrum was distorted because of the small size of the element. Errors caused by X-ray escape and by the energy dependency of the photoelectric absorption process were appreciable; however, these errors are specific to narrow energy ranges and can be corrected. The response function of the detector to monochromatic 59.54 keV /sup 241/Am gamma-rays was measured and, by fitting the results to a calibration curve, this small-size CdTe detector was able to detect X-ray spectra reliably.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.211437