Determining the effective number of bits of high resolution digitizers

A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This method is useful for characterizing high resolution analog to digital converters when a pure enough signal source is not available. The signal to noise ratio...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1997-06, Vol.44 (3), p.407-410
Main Authors: Basilio Simoes, J., Loureiro, C.F.M., Landeck, J., Correia, C.M.B.A.
Format: Article
Language:English
Subjects:
Analog-digital conversion
Dynamic range
Harmonic distortion
Jitter
Linearity
Manufacturing
Nuclear physics
Signal resolution
Signal to noise ratio
System testing
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Summary:A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This method is useful for characterizing high resolution analog to digital converters when a pure enough signal source is not available. The signal to noise ratio of the digitizer, excluding the harmonic components from the noise, is the computed parameter. The use of this method to estimate jitter errors is also studied.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.603681