A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment

A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts with adequate design ma...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1997-12, Vol.44 (6), p.1981-1988
Main Authors: Pease, R.L., Cohn, L.M., Fleetwood, D.M., Gehlhausen, M.A., Turflinger, T.L., Brown, D.B., Johnston, A.H.
Format: Article
Language:English
Subjects:
Circuit testing
CMOS technology
Costs
Degradation
Ionizing radiation
Linear circuits
Manufacturing
Performance evaluation
Space technology
System testing
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Summary:A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts with adequate design margin and/or well behaved parts a generic elevated temperature irradiation test is proposed.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.658976