Loading…
The non-invasive inspection of baggage using coherent X-ray scattering
An inspection technique based on angular dispersive X-ray diffraction (ADXRD) has been developed to chemically specific detection of explosives for screening applications. The technique identifies explosives from benign materials using the characteristic Bragg features seen in coherently scattered X...
Saved in:
Published in: | IEEE transactions on nuclear science 2000-12, Vol.47 (6), p.1987-1994 |
---|---|
Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73 |
---|---|
cites | cdi_FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73 |
container_end_page | 1994 |
container_issue | 6 |
container_start_page | 1987 |
container_title | IEEE transactions on nuclear science |
container_volume | 47 |
creator | Jupp, I.D. Durrant, P.T. Ramsden, D. Carter, T. Dermody, G. Pleasants, I.B. Burrows, D. |
description | An inspection technique based on angular dispersive X-ray diffraction (ADXRD) has been developed to chemically specific detection of explosives for screening applications. The technique identifies explosives from benign materials using the characteristic Bragg features seen in coherently scattered X-rays. To implement this technique in a prototype screening system, a detector has been designed which, when coupled with the appropriate analysis algorithm, provides chemically specific material identification. Profile analysis has been performed using the Singular Value Decomposition (SVD) maximum likelihood technique. The detector system combines a custom designed collimator with an X-ray image intensifier tube and is capable of acquiring diffraction profiles from several independent volume elements (voxels) within the region of interest. The acquisition of spatially and energy resolved diffraction profiles for both benign and explosive materials using a separate cooled germanium detector, has allowed the data analysis algorithm to be optimised. Results from the prototype detector system show that explosives such as Semtex, RDX, and PETN have sufficient order to produce unique diffraction profiles, which may then be differentiated from benign materials. |
doi_str_mv | 10.1109/23.903834 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_23_903834</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>903834</ieee_id><sourcerecordid>2636839641</sourcerecordid><originalsourceid>FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73</originalsourceid><addsrcrecordid>eNqN0U1LAzEQBuAgCtaPg1dPAUHxsDWfm-QoxapQ8FLB25JmZ7db2mxNdgv990a2ePAgnoaZ92FgGISuKBlTSswD42NDuObiCI2olDqjUuljNCKE6swIY07RWYyr1ApJ5AhN50vAvvVZ43c2NjvAjY9bcF3TetxWeGHr2taA-9j4Grt2CQF8hz-yYPc4Ott1EFJygU4qu45weajn6H36NJ-8ZLO359fJ4yxzPNddJp2wltDKkbI0TFa0pNYwrRmXoB0raS6Zg9JqDiUrTV5JAFMpySCN1ELxc3Q37N2G9rOH2BWbJjpYr62Hto-FoSLnLFd5krd_SqbztFL8AyoliFI8wZtfcNX2wadzC0oIE0JKwZK6H5QLbYwBqmIbmo0N-4SK7xcVjBfDi5K9HmwDAD_uEH4BPZuKTg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1002445542</pqid></control><display><type>article</type><title>The non-invasive inspection of baggage using coherent X-ray scattering</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Jupp, I.D. ; Durrant, P.T. ; Ramsden, D. ; Carter, T. ; Dermody, G. ; Pleasants, I.B. ; Burrows, D.</creator><creatorcontrib>Jupp, I.D. ; Durrant, P.T. ; Ramsden, D. ; Carter, T. ; Dermody, G. ; Pleasants, I.B. ; Burrows, D.</creatorcontrib><description>An inspection technique based on angular dispersive X-ray diffraction (ADXRD) has been developed to chemically specific detection of explosives for screening applications. The technique identifies explosives from benign materials using the characteristic Bragg features seen in coherently scattered X-rays. To implement this technique in a prototype screening system, a detector has been designed which, when coupled with the appropriate analysis algorithm, provides chemically specific material identification. Profile analysis has been performed using the Singular Value Decomposition (SVD) maximum likelihood technique. The detector system combines a custom designed collimator with an X-ray image intensifier tube and is capable of acquiring diffraction profiles from several independent volume elements (voxels) within the region of interest. The acquisition of spatially and energy resolved diffraction profiles for both benign and explosive materials using a separate cooled germanium detector, has allowed the data analysis algorithm to be optimised. Results from the prototype detector system show that explosives such as Semtex, RDX, and PETN have sufficient order to produce unique diffraction profiles, which may then be differentiated from benign materials.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/23.903834</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithm design and analysis ; Algorithms ; Chemical analysis ; Coherent scattering ; Detectors ; Diffraction ; Dispersion ; Explosives ; Inspection ; Prototypes ; X-ray detection ; X-ray detectors ; X-ray diffraction ; X-ray scattering ; X-rays</subject><ispartof>IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.1987-1994</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73</citedby><cites>FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/903834$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Jupp, I.D.</creatorcontrib><creatorcontrib>Durrant, P.T.</creatorcontrib><creatorcontrib>Ramsden, D.</creatorcontrib><creatorcontrib>Carter, T.</creatorcontrib><creatorcontrib>Dermody, G.</creatorcontrib><creatorcontrib>Pleasants, I.B.</creatorcontrib><creatorcontrib>Burrows, D.</creatorcontrib><title>The non-invasive inspection of baggage using coherent X-ray scattering</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>An inspection technique based on angular dispersive X-ray diffraction (ADXRD) has been developed to chemically specific detection of explosives for screening applications. The technique identifies explosives from benign materials using the characteristic Bragg features seen in coherently scattered X-rays. To implement this technique in a prototype screening system, a detector has been designed which, when coupled with the appropriate analysis algorithm, provides chemically specific material identification. Profile analysis has been performed using the Singular Value Decomposition (SVD) maximum likelihood technique. The detector system combines a custom designed collimator with an X-ray image intensifier tube and is capable of acquiring diffraction profiles from several independent volume elements (voxels) within the region of interest. The acquisition of spatially and energy resolved diffraction profiles for both benign and explosive materials using a separate cooled germanium detector, has allowed the data analysis algorithm to be optimised. Results from the prototype detector system show that explosives such as Semtex, RDX, and PETN have sufficient order to produce unique diffraction profiles, which may then be differentiated from benign materials.</description><subject>Algorithm design and analysis</subject><subject>Algorithms</subject><subject>Chemical analysis</subject><subject>Coherent scattering</subject><subject>Detectors</subject><subject>Diffraction</subject><subject>Dispersion</subject><subject>Explosives</subject><subject>Inspection</subject><subject>Prototypes</subject><subject>X-ray detection</subject><subject>X-ray detectors</subject><subject>X-ray diffraction</subject><subject>X-ray scattering</subject><subject>X-rays</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqN0U1LAzEQBuAgCtaPg1dPAUHxsDWfm-QoxapQ8FLB25JmZ7db2mxNdgv990a2ePAgnoaZ92FgGISuKBlTSswD42NDuObiCI2olDqjUuljNCKE6swIY07RWYyr1ApJ5AhN50vAvvVZ43c2NjvAjY9bcF3TetxWeGHr2taA-9j4Grt2CQF8hz-yYPc4Ott1EFJygU4qu45weajn6H36NJ-8ZLO359fJ4yxzPNddJp2wltDKkbI0TFa0pNYwrRmXoB0raS6Zg9JqDiUrTV5JAFMpySCN1ELxc3Q37N2G9rOH2BWbJjpYr62Hto-FoSLnLFd5krd_SqbztFL8AyoliFI8wZtfcNX2wadzC0oIE0JKwZK6H5QLbYwBqmIbmo0N-4SK7xcVjBfDi5K9HmwDAD_uEH4BPZuKTg</recordid><startdate>20001201</startdate><enddate>20001201</enddate><creator>Jupp, I.D.</creator><creator>Durrant, P.T.</creator><creator>Ramsden, D.</creator><creator>Carter, T.</creator><creator>Dermody, G.</creator><creator>Pleasants, I.B.</creator><creator>Burrows, D.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>20001201</creationdate><title>The non-invasive inspection of baggage using coherent X-ray scattering</title><author>Jupp, I.D. ; Durrant, P.T. ; Ramsden, D. ; Carter, T. ; Dermody, G. ; Pleasants, I.B. ; Burrows, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Algorithm design and analysis</topic><topic>Algorithms</topic><topic>Chemical analysis</topic><topic>Coherent scattering</topic><topic>Detectors</topic><topic>Diffraction</topic><topic>Dispersion</topic><topic>Explosives</topic><topic>Inspection</topic><topic>Prototypes</topic><topic>X-ray detection</topic><topic>X-ray detectors</topic><topic>X-ray diffraction</topic><topic>X-ray scattering</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jupp, I.D.</creatorcontrib><creatorcontrib>Durrant, P.T.</creatorcontrib><creatorcontrib>Ramsden, D.</creatorcontrib><creatorcontrib>Carter, T.</creatorcontrib><creatorcontrib>Dermody, G.</creatorcontrib><creatorcontrib>Pleasants, I.B.</creatorcontrib><creatorcontrib>Burrows, D.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore / Electronic Library Online (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jupp, I.D.</au><au>Durrant, P.T.</au><au>Ramsden, D.</au><au>Carter, T.</au><au>Dermody, G.</au><au>Pleasants, I.B.</au><au>Burrows, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The non-invasive inspection of baggage using coherent X-ray scattering</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2000-12-01</date><risdate>2000</risdate><volume>47</volume><issue>6</issue><spage>1987</spage><epage>1994</epage><pages>1987-1994</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>An inspection technique based on angular dispersive X-ray diffraction (ADXRD) has been developed to chemically specific detection of explosives for screening applications. The technique identifies explosives from benign materials using the characteristic Bragg features seen in coherently scattered X-rays. To implement this technique in a prototype screening system, a detector has been designed which, when coupled with the appropriate analysis algorithm, provides chemically specific material identification. Profile analysis has been performed using the Singular Value Decomposition (SVD) maximum likelihood technique. The detector system combines a custom designed collimator with an X-ray image intensifier tube and is capable of acquiring diffraction profiles from several independent volume elements (voxels) within the region of interest. The acquisition of spatially and energy resolved diffraction profiles for both benign and explosive materials using a separate cooled germanium detector, has allowed the data analysis algorithm to be optimised. Results from the prototype detector system show that explosives such as Semtex, RDX, and PETN have sufficient order to produce unique diffraction profiles, which may then be differentiated from benign materials.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/23.903834</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9499 |
ispartof | IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.1987-1994 |
issn | 0018-9499 1558-1578 |
language | eng |
recordid | cdi_crossref_primary_10_1109_23_903834 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Algorithm design and analysis Algorithms Chemical analysis Coherent scattering Detectors Diffraction Dispersion Explosives Inspection Prototypes X-ray detection X-ray detectors X-ray diffraction X-ray scattering X-rays |
title | The non-invasive inspection of baggage using coherent X-ray scattering |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T10%3A32%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20non-invasive%20inspection%20of%20baggage%20using%20coherent%20X-ray%20scattering&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Jupp,%20I.D.&rft.date=2000-12-01&rft.volume=47&rft.issue=6&rft.spage=1987&rft.epage=1994&rft.pages=1987-1994&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/23.903834&rft_dat=%3Cproquest_cross%3E2636839641%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c368t-5c4aa01fc0dd925f1d1a9288235e8c2d1652ceda83ed2d96f5ee9f752ea837b73%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1002445542&rft_id=info:pmid/&rft_ieee_id=903834&rfr_iscdi=true |