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A variance-reduction technique via fault-expansion for fault-coverage estimation
The estimation of fault coverage (FC) for ultra dependable systems is a daunting task. Typically, system FC is estimated via experimental techniques such as fault injection, and the gathered data are analyzed using statistical models. Specifically, faults are randomly selected, then injected into th...
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Published in: | IEEE transactions on reliability 1997-09, Vol.46 (3), p.366-374 |
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description | The estimation of fault coverage (FC) for ultra dependable systems is a daunting task. Typically, system FC is estimated via experimental techniques such as fault injection, and the gathered data are analyzed using statistical models. Specifically, faults are randomly selected, then injected into the system, and the response of the system is recorded. If the injected fault is detected, then the result is recorded as a 1; otherwise it is a 0. A point estimate and s-confidence interval are then derived from the experimental data. The difficulty with this approach is that ultra-dependable systems have FC, C/spl ges/1-10/sup -5/. To estimate C accurately requires: more than 10/sup i/ data points, i/spl equiv/-log/sub 10/(1-C). A technique for enumerating equivalent fault classes can be used to reduce the number of required experiments. The enumeration process is fault expansion, which determines the set of equivalent faults via an analysis of the system structure. This paper presents a fault expansion (FE), variance reduction technique (VRT) that uses the expanded fault data to calculate a point estimate and confidence interval for the fault detection coverage. This FE-VRT can reduce appreciably the number of fault injection experiments required to estimate C for an ultra-dependable system. Typically, performing fault injection experiments is costly, in terms of both process time and computer resources. Fault injection results and the equivalent expanded fault-set for each fault are included in this paper to demonstrate the power of FE-VRT. FE-VRT is a viable method for increasing the accuracy of a FC estimate. |
doi_str_mv | 10.1109/24.664008 |
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Typically, system FC is estimated via experimental techniques such as fault injection, and the gathered data are analyzed using statistical models. Specifically, faults are randomly selected, then injected into the system, and the response of the system is recorded. If the injected fault is detected, then the result is recorded as a 1; otherwise it is a 0. A point estimate and s-confidence interval are then derived from the experimental data. The difficulty with this approach is that ultra-dependable systems have FC, C/spl ges/1-10/sup -5/. To estimate C accurately requires: more than 10/sup i/ data points, i/spl equiv/-log/sub 10/(1-C). A technique for enumerating equivalent fault classes can be used to reduce the number of required experiments. The enumeration process is fault expansion, which determines the set of equivalent faults via an analysis of the system structure. This paper presents a fault expansion (FE), variance reduction technique (VRT) that uses the expanded fault data to calculate a point estimate and confidence interval for the fault detection coverage. This FE-VRT can reduce appreciably the number of fault injection experiments required to estimate C for an ultra-dependable system. Typically, performing fault injection experiments is costly, in terms of both process time and computer resources. Fault injection results and the equivalent expanded fault-set for each fault are included in this paper to demonstrate the power of FE-VRT. FE-VRT is a viable method for increasing the accuracy of a FC estimate.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/24.664008</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit faults ; Computational efficiency ; Control systems ; Data analysis ; Electronics ; Exact sciences and technology ; Fault detection ; Instruction sets ; Iron ; Performance evaluation ; Reactive power ; Switches ; Testing, measurement, noise and reliability</subject><ispartof>IEEE transactions on reliability, 1997-09, Vol.46 (3), p.366-374</ispartof><rights>1998 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-3b48f66a701c1876c7ad7a455cb71658ac299f76e805f7efbae34a3b3f3b94a53</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/664008$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2107552$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Smith, D.T.</creatorcontrib><creatorcontrib>Johnson, B.W.</creatorcontrib><creatorcontrib>Andrianos, N.</creatorcontrib><creatorcontrib>Profeta, J.A.</creatorcontrib><title>A variance-reduction technique via fault-expansion for fault-coverage estimation</title><title>IEEE transactions on reliability</title><addtitle>TR</addtitle><description>The estimation of fault coverage (FC) for ultra dependable systems is a daunting task. Typically, system FC is estimated via experimental techniques such as fault injection, and the gathered data are analyzed using statistical models. Specifically, faults are randomly selected, then injected into the system, and the response of the system is recorded. If the injected fault is detected, then the result is recorded as a 1; otherwise it is a 0. A point estimate and s-confidence interval are then derived from the experimental data. The difficulty with this approach is that ultra-dependable systems have FC, C/spl ges/1-10/sup -5/. To estimate C accurately requires: more than 10/sup i/ data points, i/spl equiv/-log/sub 10/(1-C). A technique for enumerating equivalent fault classes can be used to reduce the number of required experiments. The enumeration process is fault expansion, which determines the set of equivalent faults via an analysis of the system structure. This paper presents a fault expansion (FE), variance reduction technique (VRT) that uses the expanded fault data to calculate a point estimate and confidence interval for the fault detection coverage. This FE-VRT can reduce appreciably the number of fault injection experiments required to estimate C for an ultra-dependable system. Typically, performing fault injection experiments is costly, in terms of both process time and computer resources. Fault injection results and the equivalent expanded fault-set for each fault are included in this paper to demonstrate the power of FE-VRT. FE-VRT is a viable method for increasing the accuracy of a FC estimate.</description><subject>Applied sciences</subject><subject>Circuit faults</subject><subject>Computational efficiency</subject><subject>Control systems</subject><subject>Data analysis</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault detection</subject><subject>Instruction sets</subject><subject>Iron</subject><subject>Performance evaluation</subject><subject>Reactive power</subject><subject>Switches</subject><subject>Testing, measurement, noise and reliability</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNqFkctLw0AQxhdRsFYPXj3lIIKH1H3v5ljEFxT0oOcw2c5qJE3qblL0v3dLQ689DTPfbz7mQcglozPGaHHH5UxrSak9IhOmlM2Z4eyYTChlNi8UL07JWYzfKZWysBPyNs82EGpoHeYBl4Pr667NenRfbf0zYLapIfMwNH2Ov2to41b1XRhrrttggE_MMPb1Cra95-TEQxPxYoxT8vH48H7_nC9en17u54vcCW37XFTSeq3BUOaYNdoZWBqQSrnKMK0sOF4U3mi0VHmDvgIUEkQlvKgKCUpMyc3Odx26NGjsy1UdHTYNtNgNseSFZYwbexi02ojEHga1ktRykcDbHehCF2NAX65D2j78lYyW2y-UXJa7LyT2ejSF6KDxIV26jvsGzqhRiifsaofViLhXR49_KPmO1g</recordid><startdate>19970901</startdate><enddate>19970901</enddate><creator>Smith, D.T.</creator><creator>Johnson, B.W.</creator><creator>Andrianos, N.</creator><creator>Profeta, J.A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>19970901</creationdate><title>A variance-reduction technique via fault-expansion for fault-coverage estimation</title><author>Smith, D.T. ; Johnson, B.W. ; Andrianos, N. ; Profeta, J.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-3b48f66a701c1876c7ad7a455cb71658ac299f76e805f7efbae34a3b3f3b94a53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Applied sciences</topic><topic>Circuit faults</topic><topic>Computational efficiency</topic><topic>Control systems</topic><topic>Data analysis</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fault detection</topic><topic>Instruction sets</topic><topic>Iron</topic><topic>Performance evaluation</topic><topic>Reactive power</topic><topic>Switches</topic><topic>Testing, measurement, noise and reliability</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Smith, D.T.</creatorcontrib><creatorcontrib>Johnson, B.W.</creatorcontrib><creatorcontrib>Andrianos, N.</creatorcontrib><creatorcontrib>Profeta, J.A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Smith, D.T.</au><au>Johnson, B.W.</au><au>Andrianos, N.</au><au>Profeta, J.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A variance-reduction technique via fault-expansion for fault-coverage estimation</atitle><jtitle>IEEE transactions on reliability</jtitle><stitle>TR</stitle><date>1997-09-01</date><risdate>1997</risdate><volume>46</volume><issue>3</issue><spage>366</spage><epage>374</epage><pages>366-374</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IERQAD</coden><abstract>The estimation of fault coverage (FC) for ultra dependable systems is a daunting task. Typically, system FC is estimated via experimental techniques such as fault injection, and the gathered data are analyzed using statistical models. Specifically, faults are randomly selected, then injected into the system, and the response of the system is recorded. If the injected fault is detected, then the result is recorded as a 1; otherwise it is a 0. A point estimate and s-confidence interval are then derived from the experimental data. The difficulty with this approach is that ultra-dependable systems have FC, C/spl ges/1-10/sup -5/. To estimate C accurately requires: more than 10/sup i/ data points, i/spl equiv/-log/sub 10/(1-C). A technique for enumerating equivalent fault classes can be used to reduce the number of required experiments. The enumeration process is fault expansion, which determines the set of equivalent faults via an analysis of the system structure. This paper presents a fault expansion (FE), variance reduction technique (VRT) that uses the expanded fault data to calculate a point estimate and confidence interval for the fault detection coverage. This FE-VRT can reduce appreciably the number of fault injection experiments required to estimate C for an ultra-dependable system. Typically, performing fault injection experiments is costly, in terms of both process time and computer resources. Fault injection results and the equivalent expanded fault-set for each fault are included in this paper to demonstrate the power of FE-VRT. FE-VRT is a viable method for increasing the accuracy of a FC estimate.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/24.664008</doi><tpages>9</tpages></addata></record> |
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subjects | Applied sciences Circuit faults Computational efficiency Control systems Data analysis Electronics Exact sciences and technology Fault detection Instruction sets Iron Performance evaluation Reactive power Switches Testing, measurement, noise and reliability |
title | A variance-reduction technique via fault-expansion for fault-coverage estimation |
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