Loading…
Dust test results on multicontact circuit board connectors
A study to determine if the normal force of a connector is a factor in maintaining a low contact resistance after an accumulation of dust in the pins and receptacles is discussed. A dust mixture of hygroscopic salts and natural mineral particles was used. The test connectors included the standard 2-...
Saved in:
Published in: | IEEE transactions on components, hybrids, and manufacturing technology hybrids, and manufacturing technology, 1991-12, Vol.14 (4), p.802-808 |
---|---|
Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | A study to determine if the normal force of a connector is a factor in maintaining a low contact resistance after an accumulation of dust in the pins and receptacles is discussed. A dust mixture of hygroscopic salts and natural mineral particles was used. The test connectors included the standard 2-mm connector with a nominal normal force of 0.55 N, a special 2-mm connector with an extra low normal force of 0.35 N, and another connector with a normal force of about 1.5 N. Resistance values, as compared with values measured before the dust exposure, increased by less than 4 m Omega for the contact pair showing the largest increase. The results indicate that the lower normal force in high-density connectors does not adversely affect the ability of the connector system to tolerate particulate contaminants.< > |
---|---|
ISSN: | 0148-6411 1558-3082 |
DOI: | 10.1109/33.105137 |