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Analysis of propagation delays in high-speed VLSI circuits using a distributed line model

A scattering parameter-based homogeneous distributed-line model with arbitrary initial and boundary conditions is proposed and its implementation in a general-purpose circuit simulator supporting user functions is described. Using a GaAs 0.5- mu m MESFET technology, the chip delays in very high-spee...

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Published in:IEEE transactions on computer-aided design of integrated circuits and systems 1990-08, Vol.9 (8), p.821-826
Main Authors: Passlack, M., Uhle, M., Elschner, H.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c334t-fed9a3ea5aaaf1a47db90ca355f7159fdc55810c3fa616da18dce0b401b8e4d23
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description A scattering parameter-based homogeneous distributed-line model with arbitrary initial and boundary conditions is proposed and its implementation in a general-purpose circuit simulator supporting user functions is described. Using a GaAs 0.5- mu m MESFET technology, the chip delays in very high-speed VLSI circuits are calculated. The performance requirements of transistors for high-density integration and for long-distance interconnection drivers are discussed with respect to properties of lossy and lossless interconnection lines. The evaluation of chip delays shows that sub-100-ps VLSI circuits (gate count beyond 10/sup 5/) should involve: (1) complementary logic gates using transistors with transconductance of 1-2.5 S/mm; and (2) high T/sub c/ superconducting long-distance interconnection lines driven by bipolar circuits with transconductance of 2.5 S/mm, unless such long lines can be overcome by new chip architectures.< >
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identifier ISSN: 0278-0070
ispartof IEEE transactions on computer-aided design of integrated circuits and systems, 1990-08, Vol.9 (8), p.821-826
issn 0278-0070
1937-4151
language eng
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source IEEE Electronic Library (IEL) Journals
subjects Applied sciences
Boundary conditions
Circuit simulation
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Gallium arsenide
Integrated circuit interconnections
Integrated circuits
MESFET circuits
Propagation delay
Scattering parameters
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting logic circuits
Transconductance
Very large scale integration
title Analysis of propagation delays in high-speed VLSI circuits using a distributed line model
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