An improved procedure to calculate the refractive index profile from the measured near-field intensity

Refractive index profile of optical waveguides is reconstructed from the measured transmitted near-field intensity. A Butterworth low-pass digital filter is employed in the frequency domain to remove impulsive and high frequency fluctuations which have severe effects on the procedure to calculate th...

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Bibliographic Details
Published in:Journal of lightwave technology 1996-03, Vol.14 (3), p.423-428
Main Authors: Mansour, I., Caccavale, F.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Digital filters
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fluctuations
Frequency domain analysis
Frequency measurement
Integrated optics. Optical fibers and wave guides
Optical and optoelectronic circuits
Optical filters
Optical refraction
Optical variables control
Optical waveguides
Power measurement
Refractive index
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Summary:Refractive index profile of optical waveguides is reconstructed from the measured transmitted near-field intensity. A Butterworth low-pass digital filter is employed in the frequency domain to remove impulsive and high frequency fluctuations which have severe effects on the procedure to calculate the index profile from the measured power intensity. The proposed method has been applied to measure the index profile of monomode optical fiber, Ti:LiNbO/sub 3/ and buried MgTi:LiNbO/sub 3/ channel waveguides.
ISSN:0733-8724
1558-2213
DOI:10.1109/50.485603