The correlation between gate current and substrate current in 0.1 /spl mu/m NMOSFET's

Saved in:
Bibliographic Details
Published in:IEEE electron device letters 1994-10, Vol.15 (10), p.418-420
Main Authors: Hang Hu, Jacobs, J.B., Chung, J.E., Antoniadis, D.A.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0741-3106
1558-0563
DOI:10.1109/55.320987