Lamb wave scattering analysis for reflector characterization

The potential use of guided waves for defect characterization is studied. The influence of defect shape and size on transmitted and reflected fields is considered. Using the hybrid boundary element technique, the reflection and transmission coefficients for selected guided wave modes are numerically...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 1997-01, Vol.44 (1), p.44-52
Main Authors: Younho Cho, Hongerholt, D.D., Rose, J.L.
Format: Article
Language:English
Subjects:
Acoustical measurements and instrumentation
Acoustics
Elastodynamics
Exact sciences and technology
Frequency
Fundamental areas of phenomenology (including applications)
Geometry
Inspection
Measurement and testing methods
Measurement methods and techniques in continuum mechanics of solids
Monitoring
Nondestructive testing
Physics
Reflection
Scattering
Shape measurement
Solid mechanics
Solids
Structural and continuum mechanics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The potential use of guided waves for defect characterization is studied. The influence of defect shape and size on transmitted and reflected fields is considered. Using the hybrid boundary element technique, the reflection and transmission coefficients for selected guided wave modes are numerically calculated and compared to experimental data. Selecting the aspect ratio as a shape parameter for various defects, the transmission and reflection coefficients are measured for certain guided wave modes input to the defect. The influence of defect size is then studied by monitoring the transmission and reflection coefficients for defects of various shapes and depths. The studies presented indicate that defect characterization is possible if a proper mode selection criteria can be established. The suitable features related to transmission and reflection coefficient data can also be used for algorithm development and implementation purposes of defect characterization.
ISSN:0885-3010
1525-8955
DOI:10.1109/58.585189