Morphology of barrier layer formed on YBCO

The morphology of barrier layers, such as LaSrGaO/sub 4/ (LSGO) and SrTiO/sub 3/ (STO), was investigated using an atomic force microscope (AFM) and tunnel junctions with an Au/barrier/YBCO layered structure. The barrier morphology depended strongly on both the surface roughness of YBCO films and the...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1993-03, Vol.3 (1), p.1294-1297
Main Authors: Matsui, T., Suzuki, T., Ishii, T., Tsuda, K., Nagano, M., Mukae, K.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Atomic layer deposition
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electrodes
Exact sciences and technology
Gold
Granular, melt-textured, amorphous and composite superconductors
Inhomogeneous superconductors and superconducting systems
Physics
Rough surfaces
Structure and morphology
thickness
Substrates
Superconductivity
Surface morphology
Surface roughness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Temperature
Thin film structure and morphology
Yttrium barium copper oxide
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Summary:The morphology of barrier layers, such as LaSrGaO/sub 4/ (LSGO) and SrTiO/sub 3/ (STO), was investigated using an atomic force microscope (AFM) and tunnel junctions with an Au/barrier/YBCO layered structure. The barrier morphology depended strongly on both the surface roughness of YBCO films and the deposition temperature of the barrier materials. It was improved by reducing the surface roughness of the YBCO films and keeping the deposition temperature lower than 400 degrees C during the barrier formation. The experiments performed are described, and the results are presented and discussed.< >
ISSN:1051-8223
1558-2515
DOI:10.1109/77.233386