Comparative study of electron and laser beam scanning for local electrical characterization of high-T/sub c/ thin films and junctions

The development of spatially resolved methods for an electrical characterization of thin films and junctions is essential for further progress in physics and applications of high-temperature superconductors. Two methods, electron beam and laser beam scanning, are used to get the high-resolution elec...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1999-06, Vol.9 (2), p.3925-3928
Main Authors: Shadrin, P.M., Divin, Y.Y., Keil, S., Martin, J., Huebener, R.P.
Format: Article
Language:English
Subjects:
Electron beams
Grain boundaries
High temperature superconductors
Josephson junctions
Laser beams
Laser theory
Physics
Spatial resolution
Superconducting thin films
Thermoelectricity
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Summary:The development of spatially resolved methods for an electrical characterization of thin films and junctions is essential for further progress in physics and applications of high-temperature superconductors. Two methods, electron beam and laser beam scanning, are used to get the high-resolution electrical images. In this paper we present the results of the comparison of electron- and laser-induced responses of the same high-T/sub c/ Josephson junctions. Using a laser-beam-induced thermoelectric response at room temperature and its odd-symmetric behavior across the grain boundaries, we were able to visualize the grain boundary faceting in bicrystal high-T/sub c/ Josephson junctions with the resolution of /spl sim/0.1 /spl mu/m.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.783886