Defect visualization in large area YBCO thin films by magneto-optical scanning technique

• Published in: IEEE transactions on applied superconductivity 1999-06, Vol.9 (2), p.1844-1847
• Main Authors: Kuhn, M., Schey, B., Biegel, W., Stritzker, B., Eisenmenger, J., Leiderer, P., Heismann, B., Kramer, H.-P., Neumuller, H.-W.
• Format: Article
• Language: English
• Subjects: Applied sciences; Electronics; Exact sciences and technology; High temperature superconductors; Magnetic films; Magnetooptic devices; Magnetooptic effects; Microelectronic fabrication (materials and surfaces technology); Nonuniform electric fields; Optical films; Optical microscopy; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Superconducting devices; Transistors; Visualization; Yttrium barium copper oxide
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/77.784816

Flux penetration in large area YBCO thin films has been studied by a magneto-optical scanning technique. With a new apparatus HTS films as large as 20 cm/spl times/20 cm can be investigated by scanning the films through an inhomogeneous magnetic field. The apparatus has been built to realize an effective homogeneity control of the electrical properties of large area HTS thin films used for device fabrication. Magnetic flux penetration into YBCO thin films of different sizes and with intrinsic defects as well as artificial ones have been studied at 50 K. Magneto-optical measurements are compared with optical microscopy (OM) and inductive j/sub c/-characterizations. A correlation between the kind of defect and its influence on the electrical properties has been studied with regard to device applications, YBCO films structured especially for high current applications were investigated magneto-optically. These results will be compared to optical photographs of the quenching process caused by currents I>I/sub c/.