Ferroelectric characterisation using Josephson junctions

Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900 GHz are reported. The permittivity was measured using Josephson junctions coupled to external resonators. The permittivity was found to decrease with decreasing film thickne...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.1158-1161
Main Authors: McBrien, P.F., Booij, W.E., Burnell, G., Kahlmann, F., Blamire, M.G., Romans, R.J., Pegrum, C.M., Tarte, E.J.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectric measurements
Dielectric properties of solids and liquids
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Exact sciences and technology
Ferroelectric films
Ferroelectric materials
Frequency measurement
Josephson junctions
Permittivity (dielectric function)
Permittivity measurement
Physics
Strontium
Thickness measurement
Titanium compounds
Voltage
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Summary:Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900 GHz are reported. The permittivity was measured using Josephson junctions coupled to external resonators. The permittivity was found to decrease with decreasing film thickness and was frequency independent. On application of a dielectric bias voltage, the permittivity of a 200 nm film was tunable between 245 and 112 at 30 K.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.919554