Investigation of Recovery Phenomena in Hf 0.5 Zr 0.5 O 2 -Based 1T1C FeRAM

Saved in:
Bibliographic Details
Published in:IEEE journal of the Electron Devices Society 2023, Vol.11, p.43-46
Main Authors: Okuno, Jun, Yonai, Tsubasa, Kunihiro, Takafumi, Shuto, Yusuke, Alcala, Ruben, Lederer, Maximilian, Seidel, Konrad, Mikolajick, Thomas, Schroeder, Uwe, Tsukamoto, Masanori, Umebayashi, Taku
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:2168-6734
2168-6734
DOI:10.1109/JEDS.2022.3230402