Investigation of Recovery Phenomena in Hf 0.5 Zr 0.5 O 2 -Based 1T1C FeRAM

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Published in:IEEE journal of the Electron Devices Society 2023, Vol.11, p.43-46
Main Authors: Okuno, Jun, Yonai, Tsubasa, Kunihiro, Takafumi, Shuto, Yusuke, Alcala, Ruben, Lederer, Maximilian, Seidel, Konrad, Mikolajick, Thomas, Schroeder, Uwe, Tsukamoto, Masanori, Umebayashi, Taku
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creator Okuno, Jun
Yonai, Tsubasa
Kunihiro, Takafumi
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Tsukamoto, Masanori
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doi_str_mv 10.1109/JEDS.2022.3230402
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title Investigation of Recovery Phenomena in Hf 0.5 Zr 0.5 O 2 -Based 1T1C FeRAM
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