Mach-Zehnder Modulator arm-length-mismatch measurement technique

This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer funct...

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Bibliographic Details
Published in:Journal of lightwave technology 2005-03, Vol.23 (3), p.1273-1277
Main Authors: Geary, K., Seong-Ku Kim, Byoung-Joon Seo, Fetterman, H.R.
Format: Article
Language:English
Subjects:
APC-CLD
Applied sciences
Arm
arm-length mismatch
Bandwidth
Bias
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Electrooptic devices
Exact sciences and technology
Integrated optics. Optical fibers and wave guides
Mach- Zehnder modulator (MZM)
Measurement techniques
Modulators
Optical and optoelectronic circuits
Optical distortion
Optical filters
Packaging
poling-induced (PI)
polymer
Polymers
time stretching
Transfer functions
Waveguides
Writing
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Summary:This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer function of a modulator at various externally applied bias points. This mismatch measurement technique is applied to a packaged polymer rib waveguide MZM, and it is shown that it has an arm-length mismatch of 1.9 /spl mu/m. Poling-induced writing is then proposed as a fabrication technique that can consistently produce polymer MZMs with arm-length-mismatch values less than 2 /spl mu/m.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2004.840010