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Mach-Zehnder Modulator arm-length-mismatch measurement technique
This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer funct...
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Published in: | Journal of lightwave technology 2005-03, Vol.23 (3), p.1273-1277 |
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container_title | Journal of lightwave technology |
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creator | Geary, K. Seong-Ku Kim Byoung-Joon Seo Fetterman, H.R. |
description | This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer function of a modulator at various externally applied bias points. This mismatch measurement technique is applied to a packaged polymer rib waveguide MZM, and it is shown that it has an arm-length mismatch of 1.9 /spl mu/m. Poling-induced writing is then proposed as a fabrication technique that can consistently produce polymer MZMs with arm-length-mismatch values less than 2 /spl mu/m. |
doi_str_mv | 10.1109/JLT.2004.840010 |
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The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer function of a modulator at various externally applied bias points. This mismatch measurement technique is applied to a packaged polymer rib waveguide MZM, and it is shown that it has an arm-length mismatch of 1.9 /spl mu/m. Poling-induced writing is then proposed as a fabrication technique that can consistently produce polymer MZMs with arm-length-mismatch values less than 2 /spl mu/m.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2004.840010</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>APC-CLD ; Applied sciences ; Arm ; arm-length mismatch ; Bandwidth ; Bias ; Circuit properties ; Electric, optical and optoelectronic circuits ; Electronics ; Electrooptic devices ; Exact sciences and technology ; Integrated optics. Optical fibers and wave guides ; Mach- Zehnder modulator (MZM) ; Measurement techniques ; Modulators ; Optical and optoelectronic circuits ; Optical distortion ; Optical filters ; Packaging ; poling-induced (PI) ; polymer ; Polymers ; time stretching ; Transfer functions ; Waveguides ; Writing</subject><ispartof>Journal of lightwave technology, 2005-03, Vol.23 (3), p.1273-1277</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-a4e1498d3efbca6bd1f0a01e6627db0d344b1da4f4e831c278d3e17c07bd253b3</citedby><cites>FETCH-LOGICAL-c414t-a4e1498d3efbca6bd1f0a01e6627db0d344b1da4f4e831c278d3e17c07bd253b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1417025$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16649800$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Geary, K.</creatorcontrib><creatorcontrib>Seong-Ku Kim</creatorcontrib><creatorcontrib>Byoung-Joon Seo</creatorcontrib><creatorcontrib>Fetterman, H.R.</creatorcontrib><title>Mach-Zehnder Modulator arm-length-mismatch measurement technique</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer function of a modulator at various externally applied bias points. This mismatch measurement technique is applied to a packaged polymer rib waveguide MZM, and it is shown that it has an arm-length mismatch of 1.9 /spl mu/m. Poling-induced writing is then proposed as a fabrication technique that can consistently produce polymer MZMs with arm-length-mismatch values less than 2 /spl mu/m.</description><subject>APC-CLD</subject><subject>Applied sciences</subject><subject>Arm</subject><subject>arm-length mismatch</subject><subject>Bandwidth</subject><subject>Bias</subject><subject>Circuit properties</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Electrooptic devices</subject><subject>Exact sciences and technology</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Mach- Zehnder modulator (MZM)</subject><subject>Measurement techniques</subject><subject>Modulators</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical distortion</subject><subject>Optical filters</subject><subject>Packaging</subject><subject>poling-induced (PI)</subject><subject>polymer</subject><subject>Polymers</subject><subject>time stretching</subject><subject>Transfer functions</subject><subject>Waveguides</subject><subject>Writing</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp90TtPwzAUBWALgUQpzAwsERKPJa2v7STOBqp4qhVLWVgix7khqfIodjLw73GUSpUYOnnw52NfH0Iugc4AaDx_X65njFIxk4JSoEdkAkEgfcaAH5MJjTj3ZcTEKTmzduOEEDKakIeV0oX_hUWTofFWbdZXqmuNp0ztV9h8d4Vfl7ZWnS68GpXtDdbYdF6HumjKnx7PyUmuKosXu3VKPp-f1otXf_nx8rZ4XPpagOh8JRBELDOOeapVmGaQU0UBw5BFWUozLkQKmRK5QMlBs2igEGkapRkLeMqn5G7M3ZrWXWu7xL1LY1WpBtveJjIOIY4oE07eHpRMUgYy5g7eH4RAGZNxAIF09Pof3bS9adzAiQxjACmCIW8-Im1aaw3mydaUtTK_LikZOkpcR8nQUTJ25E7c7GKV1arKjWp0affHwtD9GR3c1ehKRNxvC3ADB_wP7-CYrA</recordid><startdate>20050301</startdate><enddate>20050301</enddate><creator>Geary, K.</creator><creator>Seong-Ku Kim</creator><creator>Byoung-Joon Seo</creator><creator>Fetterman, H.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20050301</creationdate><title>Mach-Zehnder Modulator arm-length-mismatch measurement technique</title><author>Geary, K. ; Seong-Ku Kim ; Byoung-Joon Seo ; Fetterman, H.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c414t-a4e1498d3efbca6bd1f0a01e6627db0d344b1da4f4e831c278d3e17c07bd253b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>APC-CLD</topic><topic>Applied sciences</topic><topic>Arm</topic><topic>arm-length mismatch</topic><topic>Bandwidth</topic><topic>Bias</topic><topic>Circuit properties</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Electrooptic devices</topic><topic>Exact sciences and technology</topic><topic>Integrated optics. Optical fibers and wave guides</topic><topic>Mach- Zehnder modulator (MZM)</topic><topic>Measurement techniques</topic><topic>Modulators</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical distortion</topic><topic>Optical filters</topic><topic>Packaging</topic><topic>poling-induced (PI)</topic><topic>polymer</topic><topic>Polymers</topic><topic>time stretching</topic><topic>Transfer functions</topic><topic>Waveguides</topic><topic>Writing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Geary, K.</creatorcontrib><creatorcontrib>Seong-Ku Kim</creatorcontrib><creatorcontrib>Byoung-Joon Seo</creatorcontrib><creatorcontrib>Fetterman, H.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Geary, K.</au><au>Seong-Ku Kim</au><au>Byoung-Joon Seo</au><au>Fetterman, H.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mach-Zehnder Modulator arm-length-mismatch measurement technique</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2005-03-01</date><risdate>2005</risdate><volume>23</volume><issue>3</issue><spage>1273</spage><epage>1277</epage><pages>1273-1277</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>This paper describes a robust measurement technique for determining the effective length mismatch of the two arms of a Mach-Zehnder modulator (MZM), based on its broad-band filter characteristics. The proposed method involves measuring the V/spl pi/(/spl lambda/), n(/spl lambda/), and transfer function of a modulator at various externally applied bias points. This mismatch measurement technique is applied to a packaged polymer rib waveguide MZM, and it is shown that it has an arm-length mismatch of 1.9 /spl mu/m. Poling-induced writing is then proposed as a fabrication technique that can consistently produce polymer MZMs with arm-length-mismatch values less than 2 /spl mu/m.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JLT.2004.840010</doi><tpages>5</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Journals |
subjects | APC-CLD Applied sciences Arm arm-length mismatch Bandwidth Bias Circuit properties Electric, optical and optoelectronic circuits Electronics Electrooptic devices Exact sciences and technology Integrated optics. Optical fibers and wave guides Mach- Zehnder modulator (MZM) Measurement techniques Modulators Optical and optoelectronic circuits Optical distortion Optical filters Packaging poling-induced (PI) polymer Polymers time stretching Transfer functions Waveguides Writing |
title | Mach-Zehnder Modulator arm-length-mismatch measurement technique |
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