Loading…

A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer

We present a linear type radiofrequency ion trap mass spectrometer consisting of metal electrodes that are lithographically patterned onto two opposing planar ceramic substrates. An electric field for ion trapping is formed by applying specific voltage potentials to the electrode pattern. This techn...

Full description

Saved in:
Bibliographic Details
Published in:Journal of microelectromechanical systems 2013-08, Vol.22 (4), p.876-883
Main Authors: Hansen, Brett J., Niemi, Richard J., Hawkins, Aaron R., Lammert, Stephen A., Austin, Daniel E.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3
cites cdi_FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3
container_end_page 883
container_issue 4
container_start_page 876
container_title Journal of microelectromechanical systems
container_volume 22
creator Hansen, Brett J.
Niemi, Richard J.
Hawkins, Aaron R.
Lammert, Stephen A.
Austin, Daniel E.
description We present a linear type radiofrequency ion trap mass spectrometer consisting of metal electrodes that are lithographically patterned onto two opposing planar ceramic substrates. An electric field for ion trapping is formed by applying specific voltage potentials to the electrode pattern. This technique represents a miniaturization approach that is relatively immune to problems with surface roughness, machining complexity, electrode misalignment, and precision of electrode shape. We also present how these traps allow a thorough study of higher order nonlinear effects in the trapping field profile and their effect on mass analyzer performance. This trap has successfully performed mass analysis using both a frequency sweep for resonant ion ejection, and linear voltage amplitude ramp of the trapping field. Better-than-unit mass resolution has been achieved using frequency sweep mass analysis. Mass resolution (m/Δm) has been measured at 160 for peaks of m/z values less than 100.
doi_str_mv 10.1109/JMEMS.2013.2248128
format article
fullrecord <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JMEMS_2013_2248128</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6481424</ieee_id><sourcerecordid>27618911</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3</originalsourceid><addsrcrecordid>eNo9kM1OwzAQhC0EEqXwAnDxhWOK13Zi51iVAkWtqNQicYs2jk2D0qSyc-nb4_6op13tzDfSDiGPwEYALH_5XEwXqxFnIEacSw1cX5EB5BISBqm-jjtLVaIgVbfkLoQ_xkBKnQ3Iz5jO637T_XrcbWqDTbOnS-x761tb0dc6GG97S5cNtujptLGm911lI9TaeJh1LV1HlC4wBLraHeVtJPw9uXHYBPtwnkPy_TZdTz6S-df7bDKeJ4bnqk9A8BKFq4RCk2rkRkqhUl65ile5ysEiS0vUnCldiszxUoHTzCmhgGNlUQwJP-Ua34XgrSt2vt6i3xfAikM3xbGb4tBNce4mQs8naIch_uw8tqYOF5KrDHQOEH1PJ19trb3IWQyRXIp_jDVt2w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Hansen, Brett J. ; Niemi, Richard J. ; Hawkins, Aaron R. ; Lammert, Stephen A. ; Austin, Daniel E.</creator><creatorcontrib>Hansen, Brett J. ; Niemi, Richard J. ; Hawkins, Aaron R. ; Lammert, Stephen A. ; Austin, Daniel E.</creatorcontrib><description>We present a linear type radiofrequency ion trap mass spectrometer consisting of metal electrodes that are lithographically patterned onto two opposing planar ceramic substrates. An electric field for ion trapping is formed by applying specific voltage potentials to the electrode pattern. This technique represents a miniaturization approach that is relatively immune to problems with surface roughness, machining complexity, electrode misalignment, and precision of electrode shape. We also present how these traps allow a thorough study of higher order nonlinear effects in the trapping field profile and their effect on mass analyzer performance. This trap has successfully performed mass analysis using both a frequency sweep for resonant ion ejection, and linear voltage amplitude ramp of the trapping field. Better-than-unit mass resolution has been achieved using frequency sweep mass analysis. Mass resolution (m/Δm) has been measured at 160 for peaks of m/z values less than 100.</description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2013.2248128</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Ceramics ; Charge carrier processes ; Electric potential ; Electrodes ; Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Linear ion trap (LIT) ; mass spectrometry ; Mechanical engineering. Machine design ; Mechanical instruments, equipment and techniques ; microfabrication ; Micromechanical devices and systems ; Physics ; Precision engineering, watch making ; Radio frequency ; Substrates ; Surface treatment</subject><ispartof>Journal of microelectromechanical systems, 2013-08, Vol.22 (4), p.876-883</ispartof><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3</citedby><cites>FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6481424$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=27618911$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Hansen, Brett J.</creatorcontrib><creatorcontrib>Niemi, Richard J.</creatorcontrib><creatorcontrib>Hawkins, Aaron R.</creatorcontrib><creatorcontrib>Lammert, Stephen A.</creatorcontrib><creatorcontrib>Austin, Daniel E.</creatorcontrib><title>A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description>We present a linear type radiofrequency ion trap mass spectrometer consisting of metal electrodes that are lithographically patterned onto two opposing planar ceramic substrates. An electric field for ion trapping is formed by applying specific voltage potentials to the electrode pattern. This technique represents a miniaturization approach that is relatively immune to problems with surface roughness, machining complexity, electrode misalignment, and precision of electrode shape. We also present how these traps allow a thorough study of higher order nonlinear effects in the trapping field profile and their effect on mass analyzer performance. This trap has successfully performed mass analysis using both a frequency sweep for resonant ion ejection, and linear voltage amplitude ramp of the trapping field. Better-than-unit mass resolution has been achieved using frequency sweep mass analysis. Mass resolution (m/Δm) has been measured at 160 for peaks of m/z values less than 100.</description><subject>Applied sciences</subject><subject>Ceramics</subject><subject>Charge carrier processes</subject><subject>Electric potential</subject><subject>Electrodes</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Linear ion trap (LIT)</subject><subject>mass spectrometry</subject><subject>Mechanical engineering. Machine design</subject><subject>Mechanical instruments, equipment and techniques</subject><subject>microfabrication</subject><subject>Micromechanical devices and systems</subject><subject>Physics</subject><subject>Precision engineering, watch making</subject><subject>Radio frequency</subject><subject>Substrates</subject><subject>Surface treatment</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNo9kM1OwzAQhC0EEqXwAnDxhWOK13Zi51iVAkWtqNQicYs2jk2D0qSyc-nb4_6op13tzDfSDiGPwEYALH_5XEwXqxFnIEacSw1cX5EB5BISBqm-jjtLVaIgVbfkLoQ_xkBKnQ3Iz5jO637T_XrcbWqDTbOnS-x761tb0dc6GG97S5cNtujptLGm911lI9TaeJh1LV1HlC4wBLraHeVtJPw9uXHYBPtwnkPy_TZdTz6S-df7bDKeJ4bnqk9A8BKFq4RCk2rkRkqhUl65ile5ysEiS0vUnCldiszxUoHTzCmhgGNlUQwJP-Ua34XgrSt2vt6i3xfAikM3xbGb4tBNce4mQs8naIch_uw8tqYOF5KrDHQOEH1PJ19trb3IWQyRXIp_jDVt2w</recordid><startdate>20130801</startdate><enddate>20130801</enddate><creator>Hansen, Brett J.</creator><creator>Niemi, Richard J.</creator><creator>Hawkins, Aaron R.</creator><creator>Lammert, Stephen A.</creator><creator>Austin, Daniel E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20130801</creationdate><title>A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer</title><author>Hansen, Brett J. ; Niemi, Richard J. ; Hawkins, Aaron R. ; Lammert, Stephen A. ; Austin, Daniel E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Applied sciences</topic><topic>Ceramics</topic><topic>Charge carrier processes</topic><topic>Electric potential</topic><topic>Electrodes</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Linear ion trap (LIT)</topic><topic>mass spectrometry</topic><topic>Mechanical engineering. Machine design</topic><topic>Mechanical instruments, equipment and techniques</topic><topic>microfabrication</topic><topic>Micromechanical devices and systems</topic><topic>Physics</topic><topic>Precision engineering, watch making</topic><topic>Radio frequency</topic><topic>Substrates</topic><topic>Surface treatment</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hansen, Brett J.</creatorcontrib><creatorcontrib>Niemi, Richard J.</creatorcontrib><creatorcontrib>Hawkins, Aaron R.</creatorcontrib><creatorcontrib>Lammert, Stephen A.</creatorcontrib><creatorcontrib>Austin, Daniel E.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hansen, Brett J.</au><au>Niemi, Richard J.</au><au>Hawkins, Aaron R.</au><au>Lammert, Stephen A.</au><au>Austin, Daniel E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2013-08-01</date><risdate>2013</risdate><volume>22</volume><issue>4</issue><spage>876</spage><epage>883</epage><pages>876-883</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract>We present a linear type radiofrequency ion trap mass spectrometer consisting of metal electrodes that are lithographically patterned onto two opposing planar ceramic substrates. An electric field for ion trapping is formed by applying specific voltage potentials to the electrode pattern. This technique represents a miniaturization approach that is relatively immune to problems with surface roughness, machining complexity, electrode misalignment, and precision of electrode shape. We also present how these traps allow a thorough study of higher order nonlinear effects in the trapping field profile and their effect on mass analyzer performance. This trap has successfully performed mass analysis using both a frequency sweep for resonant ion ejection, and linear voltage amplitude ramp of the trapping field. Better-than-unit mass resolution has been achieved using frequency sweep mass analysis. Mass resolution (m/Δm) has been measured at 160 for peaks of m/z values less than 100.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JMEMS.2013.2248128</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1057-7157
ispartof Journal of microelectromechanical systems, 2013-08, Vol.22 (4), p.876-883
issn 1057-7157
1941-0158
language eng
recordid cdi_crossref_primary_10_1109_JMEMS_2013_2248128
source IEEE Electronic Library (IEL) Journals
subjects Applied sciences
Ceramics
Charge carrier processes
Electric potential
Electrodes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Linear ion trap (LIT)
mass spectrometry
Mechanical engineering. Machine design
Mechanical instruments, equipment and techniques
microfabrication
Micromechanical devices and systems
Physics
Precision engineering, watch making
Radio frequency
Substrates
Surface treatment
title A Lithographically Patterned Discrete Planar Electrode Linear Ion Trap Mass Spectrometer
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T22%3A09%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Lithographically%20Patterned%20Discrete%20Planar%20Electrode%20Linear%20Ion%20Trap%20Mass%20Spectrometer&rft.jtitle=Journal%20of%20microelectromechanical%20systems&rft.au=Hansen,%20Brett%20J.&rft.date=2013-08-01&rft.volume=22&rft.issue=4&rft.spage=876&rft.epage=883&rft.pages=876-883&rft.issn=1057-7157&rft.eissn=1941-0158&rft.coden=JMIYET&rft_id=info:doi/10.1109/JMEMS.2013.2248128&rft_dat=%3Cpascalfrancis_cross%3E27618911%3C/pascalfrancis_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c297t-132ba3fd37ac58a2c443752dfd2d9791ea05ba82078b36f2b71f80f73712adea3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6481424&rfr_iscdi=true