Loading…

Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications

A novel texturing method to realize a honeycomb texture on multicrystalline silicon solar cells is presented in this paper. The demonstrated process chain is based on nanoimprint lithography (NIL), where an ultra-violet (UV)-curable polymer layer is structured by mechanical embossing in a high-throu...

Full description

Saved in:
Bibliographic Details
Published in:IEEE journal of photovoltaics 2012-04, Vol.2 (2), p.114-122
Main Authors: Hauser, H., Michl, B., Schwarzkopf, S., Kübler, V., Müller, C., Hermle, M., Bläsi, B.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3
cites cdi_FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3
container_end_page 122
container_issue 2
container_start_page 114
container_title IEEE journal of photovoltaics
container_volume 2
creator Hauser, H.
Michl, B.
Schwarzkopf, S.
Kübler, V.
Müller, C.
Hermle, M.
Bläsi, B.
description A novel texturing method to realize a honeycomb texture on multicrystalline silicon solar cells is presented in this paper. The demonstrated process chain is based on nanoimprint lithography (NIL), where an ultra-violet (UV)-curable polymer layer is structured by mechanical embossing in a high-throughput process. This patterned polymer layer can then be used as an etching mask for plasma or wet chemical etching processes to transfer the defined pattern into the silicon substrates. Within this study, the whole process chain of this novel texturing scheme, using interference lithography, cast moulding, NIL, and plasma etching, is described with a focus on the NIL process. The textured substrates are characterized by reflection measurements, which are compared with standard solar cell textures. Besides optical measurements, first results of honeycomb textured solar cells are presented. Short-circuit current densities above 40 mA/cm 2 were achieved on high-quality float zone material. To increase the feasibility of an industrial realization of this process chain, we are developing a roller-NIL tool to structure an etching mask in a continuous in-line process. First results of this novel tool are also shown in this study.
doi_str_mv 10.1109/JPHOTOV.2012.2184265
format article
fullrecord <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JPHOTOV_2012_2184265</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6151792</ieee_id><sourcerecordid>10_1109_JPHOTOV_2012_2184265</sourcerecordid><originalsourceid>FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3</originalsourceid><addsrcrecordid>eNo9kF1LwzAUhoMoOOZ-gV7kD3Tm5KvL5SjqlOGEzd2WJE22SNeUtIL793Zsem7OgcPz8vIg9ABkCkDU49vHYrVZbaeUAJ1SmHEqxRUaURAyY5yw67-bzeAWTbruiwwjiZCSj9B2ERt3tPFg8Mb99N8pNDscPV6HOtjY4G3Q-F03MRza4dXjZej3cZd0uz9iHxNex1onXLi6xvO2HRjdh9h0d-jG67pzk8seo8_np02xyJarl9divswszaHPFNFEcEF5bg1huRQ0V8woxyoFQEGCFQY8N5Rya4wSxLPKVbniXoJk0rMx4udcm2LXJefLoeZBp2MJpDzpKS96ypOe8qJnwO7PWHDO_SMSBOSKsl-avGGn</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications</title><source>IEEE Xplore (Online service)</source><creator>Hauser, H. ; Michl, B. ; Schwarzkopf, S. ; Kübler, V. ; Müller, C. ; Hermle, M. ; Bläsi, B.</creator><creatorcontrib>Hauser, H. ; Michl, B. ; Schwarzkopf, S. ; Kübler, V. ; Müller, C. ; Hermle, M. ; Bläsi, B.</creatorcontrib><description>A novel texturing method to realize a honeycomb texture on multicrystalline silicon solar cells is presented in this paper. The demonstrated process chain is based on nanoimprint lithography (NIL), where an ultra-violet (UV)-curable polymer layer is structured by mechanical embossing in a high-throughput process. This patterned polymer layer can then be used as an etching mask for plasma or wet chemical etching processes to transfer the defined pattern into the silicon substrates. Within this study, the whole process chain of this novel texturing scheme, using interference lithography, cast moulding, NIL, and plasma etching, is described with a focus on the NIL process. The textured substrates are characterized by reflection measurements, which are compared with standard solar cell textures. Besides optical measurements, first results of honeycomb textured solar cells are presented. Short-circuit current densities above 40 mA/cm 2 were achieved on high-quality float zone material. To increase the feasibility of an industrial realization of this process chain, we are developing a roller-NIL tool to structure an etching mask in a continuous in-line process. First results of this novel tool are also shown in this study.</description><identifier>ISSN: 2156-3381</identifier><identifier>EISSN: 2156-3403</identifier><identifier>DOI: 10.1109/JPHOTOV.2012.2184265</identifier><identifier>CODEN: IJPEG8</identifier><language>eng</language><publisher>IEEE</publisher><subject>Etching ; Microstructures ; photovoltaic cells ; Plasmas ; Resists ; Silicon ; Spinning ; Substrates ; surface texture</subject><ispartof>IEEE journal of photovoltaics, 2012-04, Vol.2 (2), p.114-122</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3</citedby><cites>FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6151792$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Hauser, H.</creatorcontrib><creatorcontrib>Michl, B.</creatorcontrib><creatorcontrib>Schwarzkopf, S.</creatorcontrib><creatorcontrib>Kübler, V.</creatorcontrib><creatorcontrib>Müller, C.</creatorcontrib><creatorcontrib>Hermle, M.</creatorcontrib><creatorcontrib>Bläsi, B.</creatorcontrib><title>Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications</title><title>IEEE journal of photovoltaics</title><addtitle>JPHOTOV</addtitle><description>A novel texturing method to realize a honeycomb texture on multicrystalline silicon solar cells is presented in this paper. The demonstrated process chain is based on nanoimprint lithography (NIL), where an ultra-violet (UV)-curable polymer layer is structured by mechanical embossing in a high-throughput process. This patterned polymer layer can then be used as an etching mask for plasma or wet chemical etching processes to transfer the defined pattern into the silicon substrates. Within this study, the whole process chain of this novel texturing scheme, using interference lithography, cast moulding, NIL, and plasma etching, is described with a focus on the NIL process. The textured substrates are characterized by reflection measurements, which are compared with standard solar cell textures. Besides optical measurements, first results of honeycomb textured solar cells are presented. Short-circuit current densities above 40 mA/cm 2 were achieved on high-quality float zone material. To increase the feasibility of an industrial realization of this process chain, we are developing a roller-NIL tool to structure an etching mask in a continuous in-line process. First results of this novel tool are also shown in this study.</description><subject>Etching</subject><subject>Microstructures</subject><subject>photovoltaic cells</subject><subject>Plasmas</subject><subject>Resists</subject><subject>Silicon</subject><subject>Spinning</subject><subject>Substrates</subject><subject>surface texture</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNo9kF1LwzAUhoMoOOZ-gV7kD3Tm5KvL5SjqlOGEzd2WJE22SNeUtIL793Zsem7OgcPz8vIg9ABkCkDU49vHYrVZbaeUAJ1SmHEqxRUaURAyY5yw67-bzeAWTbruiwwjiZCSj9B2ERt3tPFg8Mb99N8pNDscPV6HOtjY4G3Q-F03MRza4dXjZej3cZd0uz9iHxNex1onXLi6xvO2HRjdh9h0d-jG67pzk8seo8_np02xyJarl9divswszaHPFNFEcEF5bg1huRQ0V8woxyoFQEGCFQY8N5Rya4wSxLPKVbniXoJk0rMx4udcm2LXJefLoeZBp2MJpDzpKS96ypOe8qJnwO7PWHDO_SMSBOSKsl-avGGn</recordid><startdate>20120401</startdate><enddate>20120401</enddate><creator>Hauser, H.</creator><creator>Michl, B.</creator><creator>Schwarzkopf, S.</creator><creator>Kübler, V.</creator><creator>Müller, C.</creator><creator>Hermle, M.</creator><creator>Bläsi, B.</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20120401</creationdate><title>Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications</title><author>Hauser, H. ; Michl, B. ; Schwarzkopf, S. ; Kübler, V. ; Müller, C. ; Hermle, M. ; Bläsi, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Etching</topic><topic>Microstructures</topic><topic>photovoltaic cells</topic><topic>Plasmas</topic><topic>Resists</topic><topic>Silicon</topic><topic>Spinning</topic><topic>Substrates</topic><topic>surface texture</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hauser, H.</creatorcontrib><creatorcontrib>Michl, B.</creatorcontrib><creatorcontrib>Schwarzkopf, S.</creatorcontrib><creatorcontrib>Kübler, V.</creatorcontrib><creatorcontrib>Müller, C.</creatorcontrib><creatorcontrib>Hermle, M.</creatorcontrib><creatorcontrib>Bläsi, B.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library Online</collection><collection>CrossRef</collection><jtitle>IEEE journal of photovoltaics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hauser, H.</au><au>Michl, B.</au><au>Schwarzkopf, S.</au><au>Kübler, V.</au><au>Müller, C.</au><au>Hermle, M.</au><au>Bläsi, B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications</atitle><jtitle>IEEE journal of photovoltaics</jtitle><stitle>JPHOTOV</stitle><date>2012-04-01</date><risdate>2012</risdate><volume>2</volume><issue>2</issue><spage>114</spage><epage>122</epage><pages>114-122</pages><issn>2156-3381</issn><eissn>2156-3403</eissn><coden>IJPEG8</coden><abstract>A novel texturing method to realize a honeycomb texture on multicrystalline silicon solar cells is presented in this paper. The demonstrated process chain is based on nanoimprint lithography (NIL), where an ultra-violet (UV)-curable polymer layer is structured by mechanical embossing in a high-throughput process. This patterned polymer layer can then be used as an etching mask for plasma or wet chemical etching processes to transfer the defined pattern into the silicon substrates. Within this study, the whole process chain of this novel texturing scheme, using interference lithography, cast moulding, NIL, and plasma etching, is described with a focus on the NIL process. The textured substrates are characterized by reflection measurements, which are compared with standard solar cell textures. Besides optical measurements, first results of honeycomb textured solar cells are presented. Short-circuit current densities above 40 mA/cm 2 were achieved on high-quality float zone material. To increase the feasibility of an industrial realization of this process chain, we are developing a roller-NIL tool to structure an etching mask in a continuous in-line process. First results of this novel tool are also shown in this study.</abstract><pub>IEEE</pub><doi>10.1109/JPHOTOV.2012.2184265</doi><tpages>9</tpages></addata></record>
fulltext fulltext
identifier ISSN: 2156-3381
ispartof IEEE journal of photovoltaics, 2012-04, Vol.2 (2), p.114-122
issn 2156-3381
2156-3403
language eng
recordid cdi_crossref_primary_10_1109_JPHOTOV_2012_2184265
source IEEE Xplore (Online service)
subjects Etching
Microstructures
photovoltaic cells
Plasmas
Resists
Silicon
Spinning
Substrates
surface texture
title Honeycomb Texturing of Silicon Via Nanoimprint Lithography for Solar Cell Applications
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T04%3A06%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Honeycomb%20Texturing%20of%20Silicon%20Via%20Nanoimprint%20Lithography%20for%20Solar%20Cell%20Applications&rft.jtitle=IEEE%20journal%20of%20photovoltaics&rft.au=Hauser,%20H.&rft.date=2012-04-01&rft.volume=2&rft.issue=2&rft.spage=114&rft.epage=122&rft.pages=114-122&rft.issn=2156-3381&rft.eissn=2156-3403&rft.coden=IJPEG8&rft_id=info:doi/10.1109/JPHOTOV.2012.2184265&rft_dat=%3Ccrossref_ieee_%3E10_1109_JPHOTOV_2012_2184265%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c271t-90a0545247cb037652793b9e3d9112161c5b1f4b224cbb950f3ded794f61636f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6151792&rfr_iscdi=true