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An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults

Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literatu...

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Published in:IEEE journal of photovoltaics 2020-05, Vol.10 (3), p.844-851
Main Authors: Saleh, Mashad Uddin, Deline, Chris, Benoit, Evan, Kingston, Samuel, Edun, Ayobami S., Jayakumar, Naveen Kumar Tumkur, Harley, Joel B., Furse, Cynthia, Scarpulla, Michael
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cited_by cdi_FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723
cites cdi_FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723
container_end_page 851
container_issue 3
container_start_page 844
container_title IEEE journal of photovoltaics
container_volume 10
creator Saleh, Mashad Uddin
Deline, Chris
Benoit, Evan
Kingston, Samuel
Edun, Ayobami S.
Jayakumar, Naveen Kumar Tumkur
Harley, Joel B.
Furse, Cynthia
Scarpulla, Michael
description Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.
doi_str_mv 10.1109/JPHOTOV.2020.2972356
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JPHOTOV_2020_2972356</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9007610</ieee_id><sourcerecordid>2393784358</sourcerecordid><originalsourceid>FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723</originalsourceid><addsrcrecordid>eNo9UF1LwzAULaLgmPsF-hD0eTMfbdI-jumcInToFHwKbXrLOtqmJulk_96MTu_L_eCcw7knCG4InhGCk_uX9SrdpJ8ziime0URQFvGzYERJxKcsxOz8b2YxuQwm1u6wL44jzsNR8DVvUboHs6_gB-kSvXcGssI3UM70DdpUDaAH3WRVi96grP1ZN-DMwW-2060Fi5xG6612eq9rl1UKLbO-dvYquCiz2sLk1MfBx_Jxs1hNX9On58X8daqYoG6aE8jjgsciLHAhyiJhGBRlOTAcR1iwEgiFWClBSwGM5YSTsKA8LDJSish_Ow5uB11tXSWtqhyordJt661KwqPEy3jQ3QDqjP7uwTq5071pvS9JWcJEHLIo9qhwQCmjrTVQys5UTWYOkmB5DFuewpbHsOUpbE-7HmgVAPxTEowFJ5j9Apetexs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2393784358</pqid></control><display><type>article</type><title>An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults</title><source>IEEE Xplore (Online service)</source><creator>Saleh, Mashad Uddin ; Deline, Chris ; Benoit, Evan ; Kingston, Samuel ; Edun, Ayobami S. ; Jayakumar, Naveen Kumar Tumkur ; Harley, Joel B. ; Furse, Cynthia ; Scarpulla, Michael</creator><creatorcontrib>Saleh, Mashad Uddin ; Deline, Chris ; Benoit, Evan ; Kingston, Samuel ; Edun, Ayobami S. ; Jayakumar, Naveen Kumar Tumkur ; Harley, Joel B. ; Furse, Cynthia ; Scarpulla, Michael ; National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><description>Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.</description><identifier>ISSN: 2156-3381</identifier><identifier>EISSN: 2156-3403</identifier><identifier>DOI: 10.1109/JPHOTOV.2020.2972356</identifier><identifier>CODEN: IJPEG8</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Accelerated degradation faults (ADF) ; arc faults ; arc faults (AF) ; Broadband ; bypass diode faults (BDF) ; Circuit faults ; connection faults (CF) ; Degradation ; Fault detection ; Fault location ; ground faults ; ground faults (GF) ; Impedance ; open-circuit (OC) faults ; photovoltaic (PV) cells ; Photovoltaic cells ; Photovoltaic systems ; Reflectometry ; Shading ; shading faults ; Short circuits ; short-circuit (SC) faults ; SOLAR ENERGY ; Spread spectrum ; spread spectrum time domain reflectometry ; spread spectrum time domain reflectometry (SSTDR) ; Time domain analysis ; Underground cables ; Wires</subject><ispartof>IEEE journal of photovoltaics, 2020-05, Vol.10 (3), p.844-851</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723</citedby><cites>FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723</cites><orcidid>0000-0002-6084-6839 ; 0000-0002-9867-8930 ; 0000-0003-2309-2051 ; 0000-0002-7139-7231 ; 0000-0003-1286-5557 ; 0000-0001-8920-1498 ; 0000000298678930 ; 0000000189201498 ; 0000000312865557 ; 0000000271397231 ; 0000000323092051 ; 0000000260846839</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9007610$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,780,784,885,27924,27925,54796</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1659850$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Saleh, Mashad Uddin</creatorcontrib><creatorcontrib>Deline, Chris</creatorcontrib><creatorcontrib>Benoit, Evan</creatorcontrib><creatorcontrib>Kingston, Samuel</creatorcontrib><creatorcontrib>Edun, Ayobami S.</creatorcontrib><creatorcontrib>Jayakumar, Naveen Kumar Tumkur</creatorcontrib><creatorcontrib>Harley, Joel B.</creatorcontrib><creatorcontrib>Furse, Cynthia</creatorcontrib><creatorcontrib>Scarpulla, Michael</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><title>An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults</title><title>IEEE journal of photovoltaics</title><addtitle>JPHOTOV</addtitle><description>Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.</description><subject>Accelerated degradation faults (ADF)</subject><subject>arc faults</subject><subject>arc faults (AF)</subject><subject>Broadband</subject><subject>bypass diode faults (BDF)</subject><subject>Circuit faults</subject><subject>connection faults (CF)</subject><subject>Degradation</subject><subject>Fault detection</subject><subject>Fault location</subject><subject>ground faults</subject><subject>ground faults (GF)</subject><subject>Impedance</subject><subject>open-circuit (OC) faults</subject><subject>photovoltaic (PV) cells</subject><subject>Photovoltaic cells</subject><subject>Photovoltaic systems</subject><subject>Reflectometry</subject><subject>Shading</subject><subject>shading faults</subject><subject>Short circuits</subject><subject>short-circuit (SC) faults</subject><subject>SOLAR ENERGY</subject><subject>Spread spectrum</subject><subject>spread spectrum time domain reflectometry</subject><subject>spread spectrum time domain reflectometry (SSTDR)</subject><subject>Time domain analysis</subject><subject>Underground cables</subject><subject>Wires</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNo9UF1LwzAULaLgmPsF-hD0eTMfbdI-jumcInToFHwKbXrLOtqmJulk_96MTu_L_eCcw7knCG4InhGCk_uX9SrdpJ8ziime0URQFvGzYERJxKcsxOz8b2YxuQwm1u6wL44jzsNR8DVvUboHs6_gB-kSvXcGssI3UM70DdpUDaAH3WRVi96grP1ZN-DMwW-2060Fi5xG6612eq9rl1UKLbO-dvYquCiz2sLk1MfBx_Jxs1hNX9On58X8daqYoG6aE8jjgsciLHAhyiJhGBRlOTAcR1iwEgiFWClBSwGM5YSTsKA8LDJSish_Ow5uB11tXSWtqhyordJt661KwqPEy3jQ3QDqjP7uwTq5071pvS9JWcJEHLIo9qhwQCmjrTVQys5UTWYOkmB5DFuewpbHsOUpbE-7HmgVAPxTEowFJ5j9Apetexs</recordid><startdate>20200501</startdate><enddate>20200501</enddate><creator>Saleh, Mashad Uddin</creator><creator>Deline, Chris</creator><creator>Benoit, Evan</creator><creator>Kingston, Samuel</creator><creator>Edun, Ayobami S.</creator><creator>Jayakumar, Naveen Kumar Tumkur</creator><creator>Harley, Joel B.</creator><creator>Furse, Cynthia</creator><creator>Scarpulla, Michael</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-6084-6839</orcidid><orcidid>https://orcid.org/0000-0002-9867-8930</orcidid><orcidid>https://orcid.org/0000-0003-2309-2051</orcidid><orcidid>https://orcid.org/0000-0002-7139-7231</orcidid><orcidid>https://orcid.org/0000-0003-1286-5557</orcidid><orcidid>https://orcid.org/0000-0001-8920-1498</orcidid><orcidid>https://orcid.org/0000000298678930</orcidid><orcidid>https://orcid.org/0000000189201498</orcidid><orcidid>https://orcid.org/0000000312865557</orcidid><orcidid>https://orcid.org/0000000271397231</orcidid><orcidid>https://orcid.org/0000000323092051</orcidid><orcidid>https://orcid.org/0000000260846839</orcidid></search><sort><creationdate>20200501</creationdate><title>An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults</title><author>Saleh, Mashad Uddin ; Deline, Chris ; Benoit, Evan ; Kingston, Samuel ; Edun, Ayobami S. ; Jayakumar, Naveen Kumar Tumkur ; Harley, Joel B. ; Furse, Cynthia ; Scarpulla, Michael</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Accelerated degradation faults (ADF)</topic><topic>arc faults</topic><topic>arc faults (AF)</topic><topic>Broadband</topic><topic>bypass diode faults (BDF)</topic><topic>Circuit faults</topic><topic>connection faults (CF)</topic><topic>Degradation</topic><topic>Fault detection</topic><topic>Fault location</topic><topic>ground faults</topic><topic>ground faults (GF)</topic><topic>Impedance</topic><topic>open-circuit (OC) faults</topic><topic>photovoltaic (PV) cells</topic><topic>Photovoltaic cells</topic><topic>Photovoltaic systems</topic><topic>Reflectometry</topic><topic>Shading</topic><topic>shading faults</topic><topic>Short circuits</topic><topic>short-circuit (SC) faults</topic><topic>SOLAR ENERGY</topic><topic>Spread spectrum</topic><topic>spread spectrum time domain reflectometry</topic><topic>spread spectrum time domain reflectometry (SSTDR)</topic><topic>Time domain analysis</topic><topic>Underground cables</topic><topic>Wires</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Saleh, Mashad Uddin</creatorcontrib><creatorcontrib>Deline, Chris</creatorcontrib><creatorcontrib>Benoit, Evan</creatorcontrib><creatorcontrib>Kingston, Samuel</creatorcontrib><creatorcontrib>Edun, Ayobami S.</creatorcontrib><creatorcontrib>Jayakumar, Naveen Kumar Tumkur</creatorcontrib><creatorcontrib>Harley, Joel B.</creatorcontrib><creatorcontrib>Furse, Cynthia</creatorcontrib><creatorcontrib>Scarpulla, Michael</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>IEEE journal of photovoltaics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Saleh, Mashad Uddin</au><au>Deline, Chris</au><au>Benoit, Evan</au><au>Kingston, Samuel</au><au>Edun, Ayobami S.</au><au>Jayakumar, Naveen Kumar Tumkur</au><au>Harley, Joel B.</au><au>Furse, Cynthia</au><au>Scarpulla, Michael</au><aucorp>National Renewable Energy Lab. (NREL), Golden, CO (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults</atitle><jtitle>IEEE journal of photovoltaics</jtitle><stitle>JPHOTOV</stitle><date>2020-05-01</date><risdate>2020</risdate><volume>10</volume><issue>3</issue><spage>844</spage><epage>851</epage><pages>844-851</pages><issn>2156-3381</issn><eissn>2156-3403</eissn><coden>IJPEG8</coden><abstract>Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/JPHOTOV.2020.2972356</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-6084-6839</orcidid><orcidid>https://orcid.org/0000-0002-9867-8930</orcidid><orcidid>https://orcid.org/0000-0003-2309-2051</orcidid><orcidid>https://orcid.org/0000-0002-7139-7231</orcidid><orcidid>https://orcid.org/0000-0003-1286-5557</orcidid><orcidid>https://orcid.org/0000-0001-8920-1498</orcidid><orcidid>https://orcid.org/0000000298678930</orcidid><orcidid>https://orcid.org/0000000189201498</orcidid><orcidid>https://orcid.org/0000000312865557</orcidid><orcidid>https://orcid.org/0000000271397231</orcidid><orcidid>https://orcid.org/0000000323092051</orcidid><orcidid>https://orcid.org/0000000260846839</orcidid><oa>free_for_read</oa></addata></record>
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identifier ISSN: 2156-3381
ispartof IEEE journal of photovoltaics, 2020-05, Vol.10 (3), p.844-851
issn 2156-3381
2156-3403
language eng
recordid cdi_crossref_primary_10_1109_JPHOTOV_2020_2972356
source IEEE Xplore (Online service)
subjects Accelerated degradation faults (ADF)
arc faults
arc faults (AF)
Broadband
bypass diode faults (BDF)
Circuit faults
connection faults (CF)
Degradation
Fault detection
Fault location
ground faults
ground faults (GF)
Impedance
open-circuit (OC) faults
photovoltaic (PV) cells
Photovoltaic cells
Photovoltaic systems
Reflectometry
Shading
shading faults
Short circuits
short-circuit (SC) faults
SOLAR ENERGY
Spread spectrum
spread spectrum time domain reflectometry
spread spectrum time domain reflectometry (SSTDR)
Time domain analysis
Underground cables
Wires
title An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T01%3A40%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=An%20Overview%20of%20Spread%20Spectrum%20Time%20Domain%20Reflectometry%20Responses%20to%20Photovoltaic%20Faults&rft.jtitle=IEEE%20journal%20of%20photovoltaics&rft.au=Saleh,%20Mashad%20Uddin&rft.aucorp=National%20Renewable%20Energy%20Lab.%20(NREL),%20Golden,%20CO%20(United%20States)&rft.date=2020-05-01&rft.volume=10&rft.issue=3&rft.spage=844&rft.epage=851&rft.pages=844-851&rft.issn=2156-3381&rft.eissn=2156-3403&rft.coden=IJPEG8&rft_id=info:doi/10.1109/JPHOTOV.2020.2972356&rft_dat=%3Cproquest_cross%3E2393784358%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c372t-b1eb8d6874d0d7fd930ec23be3085073fe12e8cc72f7e33b1614d264da1f75723%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2393784358&rft_id=info:pmid/&rft_ieee_id=9007610&rfr_iscdi=true