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An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults
Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literatu...
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Published in: | IEEE journal of photovoltaics 2020-05, Vol.10 (3), p.844-851 |
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container_title | IEEE journal of photovoltaics |
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creator | Saleh, Mashad Uddin Deline, Chris Benoit, Evan Kingston, Samuel Edun, Ayobami S. Jayakumar, Naveen Kumar Tumkur Harley, Joel B. Furse, Cynthia Scarpulla, Michael |
description | Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented. |
doi_str_mv | 10.1109/JPHOTOV.2020.2972356 |
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(NREL), Golden, CO (United States)</creatorcontrib><title>An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults</title><title>IEEE journal of photovoltaics</title><addtitle>JPHOTOV</addtitle><description>Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. 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subjects | Accelerated degradation faults (ADF) arc faults arc faults (AF) Broadband bypass diode faults (BDF) Circuit faults connection faults (CF) Degradation Fault detection Fault location ground faults ground faults (GF) Impedance open-circuit (OC) faults photovoltaic (PV) cells Photovoltaic cells Photovoltaic systems Reflectometry Shading shading faults Short circuits short-circuit (SC) faults SOLAR ENERGY Spread spectrum spread spectrum time domain reflectometry spread spectrum time domain reflectometry (SSTDR) Time domain analysis Underground cables Wires |
title | An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults |
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