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Quick Diagnostic Tool for Thin-Film Photovoltaic Power Plants Utilizing Dark Current Measurement
There exist many photovoltaic (PV) power plants which are based on thin-film technology. Unlike PV power plant with crystalline silicon technology, the diagnostic possibilities of thin-film PV modules are limited due to seasonal effects and problematic utilization of thermography. The main problem o...
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Published in: | IEEE journal of photovoltaics 2022-03, Vol.12 (2), p.565-571 |
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container_title | IEEE journal of photovoltaics |
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creator | Cerna, Ladislava Hrzina, Pavel Benda, Vitezslav Finsterle, Tomas |
description | There exist many photovoltaic (PV) power plants which are based on thin-film technology. Unlike PV power plant with crystalline silicon technology, the diagnostic possibilities of thin-film PV modules are limited due to seasonal effects and problematic utilization of thermography. The main problem of degradation of these PV plants is the area degradation which affects even PV power plants with transformer inverters. Although there exist measurement methods based on I-V curve measurement, these methods require specific climatic conditions (clear sky, sufficient irradiance) and time. Here, we present the novel approach to diagnose thin-film modules affected with degradation which provides quick results with low-cost equipment. |
doi_str_mv | 10.1109/JPHOTOV.2022.3145096 |
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Here, we present the novel approach to diagnose thin-film modules affected with degradation which provides quick results with low-cost equipment.</description><subject>Current measurement</subject><subject>Dark current</subject><subject>Dark current measurement</subject><subject>Degradation</subject><subject>diagnostics</subject><subject>Electrical resistance measurement</subject><subject>Equipment costs</subject><subject>Irradiance</subject><subject>Measurement methods</subject><subject>Modules</subject><subject>Photovoltaic cells</subject><subject>photovoltaics (PVs)</subject><subject>Power plants</subject><subject>Resistance</subject><subject>Temperature measurement</subject><subject>Thermography</subject><subject>thin-film</subject><subject>Voltage measurement</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNo9kE9PAjEQxRujiQT5BHpo4nmx_7ZLjwZUNBjWZPW6tksLhWWLbVejn94loHOZl8x7M5MfAFcYDTFG4uYpn86L-duQIEKGFLMUCX4CegSnPKEM0dM_TUf4HAxCWKOuOEo5Zz3w_tLaagMnVi4bF6KtYOFcDY3zsFjZJrm39RbmKxfdp6uj7Oa5-9Ie5rVsYoCv0db2xzZLOJF-A8et97qJ8FnL0Hq97fQFODOyDnpw7H1Q3N8V42kymz88jm9nSUWEiInCUjBZSSUYxbgyhulKL1RmUNb9KTPD0cikJFNpJgjFHDG1UIoLnKmRkYL2wfVh7c67j1aHWK5d65vuYkk4xSIdMYQ6Fzu4Ku9C8NqUO2-30n-XGJV7muWRZrmnWR5pdrHLQ8xqrf8jIkMkJSn9BaSTcgU</recordid><startdate>20220301</startdate><enddate>20220301</enddate><creator>Cerna, Ladislava</creator><creator>Hrzina, Pavel</creator><creator>Benda, Vitezslav</creator><creator>Finsterle, Tomas</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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source | IEEE Electronic Library (IEL) Journals |
subjects | Current measurement Dark current Dark current measurement Degradation diagnostics Electrical resistance measurement Equipment costs Irradiance Measurement methods Modules Photovoltaic cells photovoltaics (PVs) Power plants Resistance Temperature measurement Thermography thin-film Voltage measurement |
title | Quick Diagnostic Tool for Thin-Film Photovoltaic Power Plants Utilizing Dark Current Measurement |
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