TE/TM-Pass Polarizer Based on Lithium Niobate on Insulator Ridge Waveguide

We propose a TE/TM-pass polarizer based on a shallow X-cut lithium niobate-on-insulator (LNOI) ridge waveguide. In shallow X-cut LNOI ridge waveguides, the leaky mode is interchanged between TE and TM polarization waves depending on the ridge waveguide height. The phenomenon does not occur in silico...

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Bibliographic Details
Published in:IEEE photonics journal 2013-04, Vol.5 (2), p.6600610-6600610
Main Authors: Saitoh, E., Kawaguchi, Y., Saitoh, K., Koshiba, M.
Format: Article
Language:English
Subjects:
Extinction ratio
Indexes
Optical waveguides
Photonics
Silicon compounds
Silicon on insulator technology
Slabs
Theory and design
waveguide devices
waveguides
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Summary:We propose a TE/TM-pass polarizer based on a shallow X-cut lithium niobate-on-insulator (LNOI) ridge waveguide. In shallow X-cut LNOI ridge waveguides, the leaky mode is interchanged between TE and TM polarization waves depending on the ridge waveguide height. The phenomenon does not occur in silicon-on-insulator ridge waveguides. We use this special loss mechanism for TE/TM-pass polarizers. We evaluate structural and wavelength dependencies of polarizers by a vectorial finite-element method. The extinction ratios of 108 dB/mm and 27 dB/mm are obtained for TE-pass and TM-pass polarizers.
ISSN:1943-0655
1943-0647
DOI:10.1109/JPHOT.2013.2250938