Electro-Optical Characterization of Patterned Thin Metal Film Ni 2 Si–4H SiC Schottky Photodiodes for Ultraviolet Light Detection

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Bibliographic Details
Published in:IEEE sensors journal 2015-03, Vol.15 (3), p.1858-1863
Main Authors: Mazzillo, Massimo, Sciuto, Antonella, Marchese, Salvatore
Format: Article
Language:English
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ISSN:1530-437X
1558-1748
DOI:10.1109/JSEN.2014.2367546