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A 10K-Gate CMOS Gate Array Based on a Gate Isolation Structure
This paper describes an effect of the "gate isolation" technique and its application to a 10K-gate CMOS gate-array VLSI chip. This gate array is fabricated using a 2-/spl mu/m n-well CMOS technology, with double-level metallization. As an example, a 32-bit parallel array multiplier is desi...
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Published in: | IEEE journal of solid-state circuits 1985-02, Vol.20 (1), p.413-417 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This paper describes an effect of the "gate isolation" technique and its application to a 10K-gate CMOS gate-array VLSI chip. This gate array is fabricated using a 2-/spl mu/m n-well CMOS technology, with double-level metallization. As an example, a 32-bit parallel array multiplier is designed using a fully automatic CAD system. The density of CMOS gate arrays using gate isolation is estimated to be 1.10 to 1.26 times greater than that of the arrays using several types of oxide isolation, when implementing circuits with complexities on the order of 10K gates. |
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ISSN: | 0018-9200 1558-173X |
DOI: | 10.1109/JSSC.1985.1052322 |