Effect of SiO 2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide

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Bibliographic Details
Published in:IEEE electron device letters 2016-12, Vol.37 (12), p.1578-1581
Main Authors: Chen, Bo-Wei, Chang, Ting-Chang, Hung, Yu-Ju, Huang, Shin-Ping, Chen, Hua-Mao, Huang, Hui-Chun, Liao, Po-Yung, Chiang, Hsiao-Cheng, Zheng, Yu-Zhe, Yeh, Wei-Heng, Lin, Yu-Ho, Liang, Jonathan Siher, Chu, Ann-Kuo, Li, Hung-Wei, Tsai, Chih-Hung, Lu, Hsueh-Hsing
Format: Article
Language:English
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ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2016.2623680