Unveiling the Switching Mechanism of a TaO x /HfO 2 Self-Selective Cell by Probing the Trap Profiles With RTN Measurements

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Bibliographic Details
Published in:IEEE electron device letters 2018-08, Vol.39 (8), p.1152-1155
Main Authors: Gong, Tiancheng, Luo, Qing, Lv, Hangbing, Xu, Xiaoxin, Yu, Jie, Yuan, Peng, Dong, Danian, Chen, Chuanbing, Yin, Jiahao, Tai, Lu, Zhu, Xi, Liu, Qi, Long, Shibing, Liu, Ming
Format: Article
Language:English
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ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2018.2849730