Magnetization Damping in Nanocrystalline Yttrium Iron Garnet Thin Films Grown on Oxidized Silicon

In this letter, we report on the magnetic and structural properties of Y 3 Fe 5 O 12 (YIG) thin films deposited on a thermally oxidized silicon substrate. Broadband ferromagnetic measurements allowed us to distinguish between intrinsic and extrinsic linewidth contributions, revealing relatively low...

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Bibliographic Details
Published in:IEEE magnetics letters 2021, Vol.12, p.1-5
Main Authors: Krysztofik, Adam, Ozoglu, Sevgi, Coy, Emerson
Format: Article
Language:English
Subjects:
Broadband
Damping
Ferromagnetic materials
ferromagnetic resonance
Gilbert damping
Iron
Magnetic properties
Nonhomogeneous media
pulsed laser deposition
Reflection
Saturation magnetization
Silicon
Silicon substrates
Soft magnetic materials
Substrates
Thickness
Thin films
Yttrium
yttrium iron garnet films
Yttrium-iron garnet
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Summary:In this letter, we report on the magnetic and structural properties of Y 3 Fe 5 O 12 (YIG) thin films deposited on a thermally oxidized silicon substrate. Broadband ferromagnetic measurements allowed us to distinguish between intrinsic and extrinsic linewidth contributions, revealing relatively low values of the Gilbert damping parameter that is in the range of 10-20 × 10 -4 for film thicknesses below 100 nm. However, the inhomogeneous linewidth broadening {\mu _0}\Delta {H_0} remained larger than 30 mT as a result of structural defects. This could guide further development of YIG films integrated with silicon that exhibit low magnetic losses.
ISSN:1949-307X
1949-3088
DOI:10.1109/LMAG.2021.3086454